Trench process and structure for backside contact solar cells with polysilicon doped regions
US-8975717-B2 · Mar 10, 2015 · US
US9437763B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9437763-B2 |
| Application number | US-201514945931-A |
| Country | US |
| Kind code | B2 |
| Filing date | Nov 19, 2015 |
| Priority date | Jun 12, 2008 |
| Publication date | Sep 6, 2016 |
| Grant date | Sep 6, 2016 |
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A solar cell includes polysilicon P-type and N-type doped regions on a backside of a substrate, such as a silicon wafer. A trench structure separates the P-type doped region from the N-type doped region. Each of the P-type and N-type doped regions may be formed over a thin dielectric layer. The trench structure may include a textured surface for increased solar radiation collection. Among other advantages, the resulting structure increases efficiency by providing isolation between adjacent P-type and N-type doped regions, thereby preventing recombination in a space charge region where the doped regions would have touched.
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What is claimed is: 1. A solar cell, comprising: a solar cell substrate having a front side configured to face the sun during normal operation and a backside opposite the front side; a P-type doped region and an N-type doped region of the solar cell over the solar cell substrate; a first dielectric between the solar cell substrate and the P-type and N-type doped regions; a trench separating the P-type doped region and the N-type doped region and at least partially dividing the first dielectric, wherein a surface of the trench is textured; and a second dielectric formed over the surface of the trench. 2. The solar cell of claim 1 , further comprising a third dielectric formed in the trench over the second dielectric. 3. The solar cell of claim 2 , wherein the third dielectric comprises silicon nitride. 4. The solar cell of claim 1 , wherein the second dielectric comprises thermal oxide. 5. The solar cell of claim 1 , wherein the P-type and N-type doped regions comprise polysilicon. 6. The solar cell of claim 1 , wherein the solar cell substrate comprises silicon. 7. The solar cell of claim 6 , wherein the silicon is N-type. 8. The solar cell of claim 1 , wherein the first dielectric comprises silicon dioxide. 9. The solar cell of claim 1 , wherein the second dielectric comprises silicon dioxide. 10. The solar cell of claim 1 , further comprising interdigitated metal contact fingers electrically coupled to the P-type and N-type doped regions. 11. A semiconductor device, comprising: a P-type doped region and an N-type doped region formed on a backside of a solar cell substrate, wherein the P-type and N-type doped regions are formed over a first dielectric; a trench structure separating the P-type doped region and the N-type doped region and at least partially dividing the first dielectric, wherein a surface of the trench structure is textured; and a second dielectric formed on the surface of the trench structure. 12. The semiconductor device of claim 11 , further comprising a third dielectric formed on the second dielectric in the trench structure. 13. The semiconductor device of claim 12 , further comprising metal contacts electrically coupled to the P-type and N-type doped regions through the third dielectric. 14. The semiconductor device of claim 11 , wherein the solar cell substrate comprises silicon. 15. The semiconductor device of claim 14 , wherein the silicon is N-type. 16. The semiconductor device of claim 11 , wherein the P-type doped region and the N-type doped region comprise polysilicon. 17. A method of fabricating a solar cell, the method comprising: forming a first dielectric on a silicon substrate; forming a P-type doped region and an N-type doped region over the first dielectric; forming a trench separating the P-type doped region from the N-type doped region and at least partially separating the first dielectric; texturing a surface of the trench; and forming a second dielectric over the surface of the trench. 18. The method of claim 17 , further comprising: forming a third dielectric over the second dielectric in the trench. 19. The method of claim 17 , wherein said forming the trench includes laser trenching to separate the P-type doped region from the N-type doped region. 20. The method of claim 17 , wherein the second dielectric comprises thermal oxide.
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of the substrates or of layers on substrates, e.g. textured ITO layer on a glass substrate · CPC title
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