Electronic device manufacture

US9437431B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9437431-B2
Application numberUS-6985708-A
CountryUS
Kind codeB2
Filing dateFeb 13, 2008
Priority dateFeb 13, 2007
Publication dateSep 6, 2016
Grant dateSep 6, 2016

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

New methods are provided for manufacturing a semiconductor device. Preferred methods of the invention include depositing a photoresist on a semiconductor substrate surface followed by imaging and development of resist coating layer; applying a curable organic or inorganic composition over the resist relief image; etching to provide a relief image of the resist encased by the curable composition; and removing the resist material whereby the curable organic or inorganic composition remains in a relief image of increased pitch relative to the previously developed resist image.

First claim

Opening claim text (preview).

What is claimed is: 1. A method for fabricating an electronic device, comprising: (a) providing a chemically-amplified positive-acting photoresist relief image on a substrate; (b) applying a curable composition over the photoresist relief image to provide a composite of the photoresist and curable composition, wherein the curable composition comprises a silicon-containing component; (c) treating the composite to provide relief image of photoresist encased by curable composition; (d) exposing the composite to activating radiation to permit hardening of the curable composition and then development to remove the photoresist, wherein the curable composition crosslinks in presence of acid that migrates from the photoresist, wherein following removing the photoresist, the curable composition remains in a relief image of decreased pitch relative to the photoresist. 2. The method of claim 1 wherein a single exposure step is utilized. 3. The method of claim 1 wherein the composite is substantially free of the curable composition on the top surface of the imageable material. 4. The method of claim 1 wherein the photoresist and curable composition each contains one or more organic components and are applied by spin coating. 5. The method of claim 1 wherein the curable composition is cured after applying and prior to treating to provide a relief image. 6. A method for fabricating an electronic device, comprising: (a) applying a chemically-amplified positive-acting photoresist on a substrate surface; (b) exposing the photoresist to patterned activating radiation and developing the exposed material to provide a positive photoresist relief image; (c) applying a curable organic composition over the positive relief image to provide a composite of the photoresist and curable composition, and wherein the curable organic composition comprises a silicon-containing component; (d) curing the curable organic composition of the composite whereby the organic composition crosslinks in the presence of acid that crosslinks in the presence of acid that migrates from the photoresist; (e) treating the composite to provide a relief image of photoresist encased by the curable composition; (f) exposing the composite to activating radiation to permit hardening of the curable organic composition and then development to remove the photoresist, wherein following removing the photoresist, the curable organic composition remains in a relief image of decreased pitch relative to the previously developed photoresist. 7. The method of claim 6 wherein the curable composition is cured by flood exposure with activating radiation. 8. The method of claim 6 wherein the curable composition is cured by thermal treatment.

Assignees

Inventors

Classifications

  • Processes for improving the resolution of the masks · CPC title

  • Photolithographic processes · CPC title

  • Multiple processes, e.g. applying a further resist layer on an already in a previously step, processed pattern or textured surface · CPC title

  • Electricity · mapped topic

  • Electricity · mapped topic

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Frequently asked questions

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What does patent US9437431B2 cover?
New methods are provided for manufacturing a semiconductor device. Preferred methods of the invention include depositing a photoresist on a semiconductor substrate surface followed by imaging and development of resist coating layer; applying a curable organic or inorganic composition over the resist relief image; etching to provide a relief image of the resist encased by the curable composition…
Who is the assignee on this patent?
Trefonas Iii Peter, Chung Dong Won, Rohm & Haas Elect Mat
What technology area does this patent fall under?
Primary CPC classification H10P76/2041. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Sep 06 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).