Cobalt base film-forming method, cobalt base film-forming material, and novel compound

US9428835B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9428835-B2
Application numberUS-201214349037-A
CountryUS
Kind codeB2
Filing dateOct 4, 2012
Priority dateOct 7, 2011
Publication dateAug 30, 2016
Grant dateAug 30, 2016

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A present invention provide a technique for easily forming a high-quality cobalt base film, which have a small specific resistance. The present invention comprises a transportation process of a Co[i-C3H7NC(C2H5)N-i-C3H7]2, and a film formation process by decomposition of the Co[i-C3H7NC(C2H5)N-i-C3H7]2. The film formation process comprises at least a first film formation process and a second film formation process. In the first film formation process, a film formation chamber is supplied with at least NH3 and/or NH3 product compound, and is not virtually supplied with H2. In the second film formation process, the film formation chamber is supplied with at least NH3 and/or NH3 product compound, and H2. An internal pressure of the film formation chamber in the first film formation process is higher than an internal pressure of the film formation chamber in the second film formation process.

First claim

Opening claim text (preview).

The invention claimed is: 1. A method for forming a cobalt base film, the method comprising: transporting bis(N,N′-diisopropyl-propionamidinate)cobalt to a film formation chamber; and forming a cobalt base film on a substrate by decomposition of the bis(N,N′-diisopropyl-propionamidinate)cobalt transported to the film formation chamber; wherein: the film formation process comprises at least a first film formation process and a second film formation process; the second film formation process occurs after the first film formation process; an internal pressure of the film formation chamber in the first film formation process is higher than an internal pressure of the film formation chamber in the second film formation process; in the first film formation process, the film formation chamber is supplied with at least NH 3 and/or NH 3 product compound, and the film formation chamber is not supplied with H 2 ; in the second film formation process, the film formation chamber is supplied with at least NH 3 and/or NH 3 product compound, and H 2 ; and (the H 2 )/(the NH 3 and/or NH 3 product compound) is 0.0001 to 2 (molar ratio). 2. The method for forming a cobalt base film according to claim 1 , wherein: the bis(N,N′-diisopropyl-propionamidinate)cobalt is added to a solvent; and the bis(N,N′-diisopropyl-propionamidinate)cobalt is transported by bubbling. 3. The method for forming a cobalt base film according to claim 2 , wherein the solvent is a hydrocarbon compound. 4. The method for forming a cobalt base film according to claim 2 , wherein the solvent is an ether compound. 5. The method for forming a cobalt base film according to claim 2 , wherein the solvent comprises N,N′-diisopropyl-propionamidine. 6. The method for forming a cobalt base film according to claim 1 , wherein the cobalt base film is formed by a chemical vapor deposition. 7. The method for forming a cobalt base film according to claim 1 , wherein the cobalt base film is formed by an atomic layer control growth method. 8. The method for forming a cobalt base film according to claim 1 , wherein the heating in which the substrate is heated under the NH 3 atmosphere occurs after the film formation process. 9. The method for forming a cobalt base film according to claim 1 , wherein the heating in which the substrate is heated under NH 3 and H 2 atmosphere occurs after the film formation process. 10. The method for forming a cobalt base film according to claim 1 , wherein the heating in which the substrate is heated under NH 3 atmosphere occurs before the first film formation process. 11. The method for forming a cobalt base film according to claim 1 , wherein the heating in which the substrate is heated under NH 3 and H 2 atmosphere occurs before the first film formation process.

Assignees

Inventors

Classifications

  • without a metal-carbon linkage · CPC title

  • C23C18/08Primary

    characterised by the deposition of metallic material · CPC title

  • C23C16/18Primary

    from metallo-organic compounds · CPC title

  • Pretreatment of the material to be coated (C23C18/06 takes precedence) · CPC title

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What does patent US9428835B2 cover?
A present invention provide a technique for easily forming a high-quality cobalt base film, which have a small specific resistance. The present invention comprises a transportation process of a Co[i-C3H7NC(C2H5)N-i-C3H7]2, and a film formation process by decomposition of the Co[i-C3H7NC(C2H5)N-i-C3H7]2. The film formation process comprises at least a first film formation process and a second fi…
Who is the assignee on this patent?
Gas-Phase Growth Ltd, Tokyo Electron Ltd
What technology area does this patent fall under?
Primary CPC classification C23C18/08. Mapped technology areas include Chemistry & Metallurgy.
When was this patent published?
Publication date Tue Aug 30 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).