Sensors

Patent metadata

Field	Value
Publication number	US-9404992-B2
Application number	US-201214114006-A
Country	US
Kind code	B2
Filing date	Apr 27, 2012
Priority date	Apr 27, 2011
Publication date	Aug 2, 2016
Grant date	Aug 2, 2016

Abstract

Embodiments of the present invention provide an electromagnetic sensor ( 400 ) for detecting a microstructure of a metal target, comprising: a magnetic device ( 410, 420 ) for providing an excitation magnetic field; a magnetometer ( 430 ) for detecting a resultant magnetic field induced in a metal target; and a calibration circuit ( 450, 551, 552, 553, 554 ) for generating a calibration magnetic field for calibrating the electromagnetic sensor, wherein the calibration reference magnetic field is generated by an electrical current induced in the calibration circuit by the excitation magnetic field.

First claim

The invention claimed is:

1. An electromagnetic sensor for detecting a microstructure of a metal target, comprising:
a magnetic device for providing an excitation magnetic field;
a magnetometer for detecting a resultant magnetic field induced in a metal target; and
a calibration circuit for generating a calibration magnetic field to simulate the effect of a metal target being present proximal to the sensor for calibrating the electromagnetic sensor, wherein the calibration magnetic field is generated by an electrical current induced in the calibration circuit by the excitation magnetic field.

2. The electromagnetic sensor of claim 1 , comprising a plurality of calibration circuits.

3. The electromagnetic sensor of claim 2 , wherein each of the plurality of calibration circuits is arranged to generate the calibration magnetic field at a respective frequency range.

4. The electromagnetic sensor of claim 2 , wherein each calibration circuit comprises a respective impedance.

5. The electromagnetic sensor of claim 1 , wherein each calibration circuit comprises a calibration coil.

6. The electromagnetic sensor of claim 1 , comprising a control device for selectively controlling the generation of the calibration magnetic field.

7. The electromagnetic sensor of claim 1 , wherein the magnetometer is an induction detector coil or a Hall sensor.

8. The electromagnetic sensor of claim 1 , comprising a magnetic core.

9. The electromagnetic sensor of claim 8 , wherein the magnetic core is U-shaped or H-shaped.

10. The electromagnetic sensor of claim 8 , wherein the magnetometer is arranged proximal to a pole of the magnetic core.

11. The electromagnetic sensor of claim 1 , wherein the magnetic device comprises one or more excitation coils.

12. The electromagnetic sensor of claim 1 , comprising:
a control unit arranged to determine a calibration period and to selectively activate the calibration circuit during the calibration period.

13. The electromagnetic sensor of claim 12 , wherein the control unit is arranged to determine the calibration period based upon a detection signal output from the magnetometer.

14. The electromagnetic sensor of claim 12 , wherein the control unit is arranged to determine the calibration period based on a detection signal output from the magnetometer and a predetermined reference level.

15. The electromagnetic sensor of claim 12 , wherein the control unit comprises an input for receiving a signal from a production apparatus indicative of a time interval between metal targets, wherein the control unit is arranged to determine the calibration period based thereon.

16. The electromagnetic sensor of claim 12 , wherein the control unit is arranged to selectively control a plurality of calibration circuits.

17. The electromagnetic sensor of claim 16 , wherein the control unit is arranged to cause each of the plurality of calibration circuits to output a respective frequency.

18. A method of calibrating an electromagnetic sensor, comprising:
providing an excitation magnetic field;
causing a calibration circuit to output a calibration magnetic field wherein the calibration magnetic field simulates the effect of a metal target being present proximal to the sensor and is generated by an electrical current induced in the calibration circuit by the excitation magnetic field;
receiving a resultant magnetic field at one or more magnetometers; and
determining a calibration of the electromagnetic sensor based on the resultant magnetic field.

19. The method of claim 18 , wherein the excitation magnetic field includes a multi-frequency waveform.

20. The method of claim 18 , comprising causing a plurality of calibration circuits to each output a calibration magnetic field at a respective frequency range, and determining the calibration of the magnetic sensor at each respective frequency range.

21. The method of claim 18 , comprising determining a phase difference between the excitation magnetic field and the resultant magnetic field.

22. The method of claim 18 , comprising determining a calibration period and causing the calibration circuit to generate the calibration magnetic field during the calibration period.

23. The method of claim 22 , wherein the calibration period is a time interval between metal targets.

24. The method of claim 22 , wherein the calibration period is determined according to an output from the one or more magnetometers.

25. The method of claim 24 , wherein the calibration period is determined based on the output from the one or more magnetometers absent the calibration magnetic field.

26. The method of claim 22 , wherein the calibration period is determined according to an input signal received from a production process indicative of a time interval between metal targets.

Assignees

• Peyton Anthony Joseph
• Yin Wuliang
• Dickinson Stephen John
• Univ Manchester

Inventors

• Peyton Anthony Joseph
• Yin Wuliang
• Dickinson Stephen John

Classifications

• C21D2211/00

  Microstructure comprising significant phases · CPC title

• C21D8/12

  during manufacturing of articles with special electromagnetic properties · CPC title

• C21D11/005 Primary

  for cooling · CPC title

• G01R33/028 Primary

  Electrodynamic magnetometers · CPC title

• G01N27/80

  for investigating mechanical hardness, e.g. by investigating saturation or remanence of ferromagnetic material · CPC title