Self-aligned masks and methods of use

Patent metadata

Field	Value
Publication number	US-9403675-B2
Application number	US-201414466059-A
Country	US
Kind code	B2
Filing date	Aug 22, 2014
Priority date	Aug 22, 2013
Publication date	Aug 2, 2016
Grant date	Aug 2, 2016

Abstract

The disclosure relates to a method for forming a nanoscale structure by forming a pattern on a selectively etched layer located on top of a substrate using lithography, wherein the pattern results a gap having sidewalls, performing RIE on the gap having sidewalls, wherein RIE results in the formation of a self-aligned mask on the bottom wall of the gap with unprotected regions on the bottom wall of the gap near the junctions with the sidewalls, and wet etching the gap having a self-aligned mask and unprotected regions to remove the substrate under the unprotected regions to form a nanoscale structure in the substrate. The disclosure also relates to a nanoscale structure array including a plurality of nanotrenches, nanochannels or nanofins having a width of 50 nm or less and an average variation in width of 5% or less along the entire length of each nanotrench, nanochannel or nanofin.

First claim

The invention claimed is:

1. A method for forming a nanoscale structure comprising:
forming a self-aligned mask comprising:
forming a pattern on a selectively etchable layer located on top of a substrate using lithography,
performing reactive ion etching (RIE) with plasma on the selectively etchable layer to transfer the pattern to the selectively etchable layer, wherein RIE results in the formation of at least one gap corresponding to the pattern and in the formation of a self-aligned mask on the bottom wall of the gap with unprotected regions on the bottom wall of the gap near the junctions with sidewalls of the gap, wherein a pattern density formed by the RIE doubles a pattern density formed by the lithography; and
etching the unprotected regions on the bottom wall of the gap to remove the substrate material under the unprotected regions to form a nanoscale structure, wherein the nanoscale structure is a nanotrench, nanochannel, or nanofin.

2. The method of claim 1 , wherein the substrate contains silicon.

3. The method of claim 2 , wherein the substrate comprises (110) orientated single crystal silicon.

4. The method of claim 3 , wherein etching comprises anisotropic wet etching with an etchant having an etching rate normal to the (111) crystalline plane of the single crystal silicon that is lower than the rate normal to other planes.

5. The method of claim 1 , wherein the selectively etchable layer comprises a dielectric film.

6. The method of claim 1 , further comprising covering the nanotrench to form the nanochannel.

7. The method of claim 1 , wherein the nanotrench has a width of 100 nm or less.

8. The method of claim 1 , wherein the nanotrench has an average variation in width of 5% or less along its entire length.

9. The method of claim 1 , wherein the nanotrench has an aspect ratio of as high as 20.

10. The method of claim 1 , wherein the nanotrench has a length of between 100 nm and 9 cm.

11. The method of claim 1 , further comprising forming an array of nanoscale structures.

12. The method of claim 11 , wherein the pattern density of the array of nanoscale structures doubles that defined by lithography.

13. The method of claim 11 , wherein the array of nanoscale structures comprises at least two nanoscale structures having different heights or depths.

14. The method of claim 1 , further comprising using lithography for forming at least one contact pad adjacent to the nanoscale structure.

15. The method of claim 1 , further comprising functionalizing walls of the nanoscale structure.

16. The method of claim 1 , further comprising thermally oxidizing walls of the nanoscale structure.

17. A nanoscale structure array comprising a plurality of nanoscale structures having a width of 100 nm or less and an average variation in width of 5% or less along the entire length of each nanoscale structure.

18. The nanoscale structure array of claim 17 , wherein walls of the nanoscale structures have been functionalized.

Assignees

• Ho Paul S
• Wu Zhuojie
• Univ Texas

Inventors

• Ho Paul S
• Wu Zhuojie

Classifications

• H10P76/4085 Primary

  characterised by the processes involved to create the masks · CPC title

• H10P50/695

  characterised by the process involved to create the mask, e.g. lift-off masks or sidewalls or to modify the mask · CPC title

• H10P50/285

  of materials not containing Si, e.g. PZT or Al2O3 · CPC title

• H10P50/283

  by chemical means · CPC title

• B81C1/00 Primary

  Manufacture or treatment of devices or systems in or on a substrate (B81C3/00 takes precedence) · CPC title