Semiconductor device structure

US9401358B1 · US · B1

Patent metadata
FieldValue
Publication numberUS-9401358-B1
Application numberUS-201514611843-A
CountryUS
Kind codeB1
Filing dateFeb 2, 2015
Priority dateJan 8, 2015
Publication dateJul 26, 2016
Grant dateJul 26, 2016

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  1. Title

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  2. Abstract

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  5. First independent claim

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A semiconductor device structure having at least one thin-film resistor structure is provided. Through the metal plug(s) or metal wirings located on different layers, a plurality of stripe segments of the thin-film resistor structure is electrically connected to ensure the thin-film resistor structure with the predetermined resistance and less averting areas in the layout design.

First claim

Opening claim text (preview).

What is claimed is: 1. A semiconductor device structure, comprising; a substrate, wherein the substrate has at least one active component region and a non-active component region, at least one thin film resistor structure is disposed in the non-active component region, and the at least one thin film resistor structure is spaced from the least one active component region with a specific distance, wherein the at least one thin film resistor structure comprises a plurality of rectangular structures and each of the plurality of rectangular structures sequentially includes an oxide layer and a metal material layer located on the oxide layer, the plurality of rectangular structures includes a first strip resistor structure and a second strip resistor structure, the first and second strip resistor structures are parallel to each other and separate from each other, and the first and second strip resistor structures are electrically connected to each other through metal connection structures, and the metal connection structures are selected from at least two of the group consisting of a wiring structure, a plug and a conductor wire structure, wherein the active component region comprises at least one elongated strip gate structure, and a long side of the thin film resistor structure is parallel to a long side of the at least one elongated strip gate structure. 2. The structure of claim 1 , wherein the plurality of rectangular structures further comprises a third strip resistor structure, the first, second and third strip resistor structures are parallel to one another and separate from one another, and the first, second and third strip resistor structures are electrically connected to one another through the metal connection structures, and the metal connection structures are selected from at least two of the group consisting of a wiring structure, a plug and a conductor wire structure. 3. The structure of claim 2 , wherein a first end of the first strip resistor structure is electrically connected with a first end of the second strip resistor structure through the wiring structure disposed thereon, a second end of the second strip resistor structure is electrically connected with a second end of the third strip resistor structure through the wiring structure disposed thereon, and a second end of the first strip resistor structure is electrically connected with a first end of the third strip resistor structure through the wiring structure disposed thereon and the conductor wire structure disposed thereon, such that the first, second and third strip resistor structures are electrically connected to one another through the metal connection structures. 4. The structure of claim 2 , wherein a first end of the second strip resistor structure is electrically connected with a first end of the third strip resistor structure through the wiring structure disposed thereon and the conductor wire structure disposed thereon, a second end of the second strip resistor structure is electrically connected with a second end of the first strip resistor structure through the wiring structure disposed thereon and the conductor wire structure disposed thereon, and a first end of the first strip resistor structure is electrically connected with a second end of the third strip resistor structure through the wiring structure disposed thereon and the conductor wire structure disposed thereon, such that the first, second and third strip resistor structures are electrically connected to one another through the metal connection structures. 5. The structure of claim 2 , wherein a first end of the first strip resistor structure is electrically connected with a first end of the second strip resistor structure through the wiring structure disposed thereon, a second end of the second strip resistor structure is electrically connected with a second end of the third strip resistor structure through the wiring structure disposed thereon, and a second end of the first strip resistor structure is electrically connected with a first end of the third strip resistor structure through the wiring structure disposed thereon, the plugs and the conductor wire structure disposed thereon, such that the first, second and third strip resistor structures are electrically connected to one another through the metal connection structures. 6. The structure of claim 2 , wherein a first end of the second strip resistor structure is electrically connected with a first end of the third strip resistor structure through the wiring structure disposed thereon, the plugs and the conductor wire structure disposed thereon, a second end of the second strip resistor structure is electrically connected with a second end of the first strip resistor structure through the wiring structure disposed thereon, the plugs and the conductor wire structure disposed thereon, and a first end of the first strip resistor structure is electrically connected with a second end of the third strip resistor structure through the wiring structure disposed thereon, the plugs and the conductor wire structure disposed thereon, such that the first, second and third strip resistor structures are electrically connected to one another through the metal connection structures. 7. The structure of claim 1 , wherein a material of the metal connection structures includes aluminum, copper, tungsten or any combination thereof. 8. The structure of claim 7 , wherein a material of the wiring structure includes tungsten. 9. The structure of claim 7 , wherein a material of the plug or the conductor wire structure includes aluminum or copper. 10. The structure of claim 1 , wherein a material of the metal material layer includes titanium nitride (TiN), tantalum nitride (TaN), chromium silicide (CrSi) or nickel-chromium alloys (NiCr). 11. The structure of claim 10 , wherein a thickness of the metal material layer ranges from 30 Å to 60 Å. 12. A semiconductor device structure, comprising; a substrate, wherein the substrate has at least one active component region and a non-active component region, at least one thin film resistor structure is disposed in the non-active component region, and the at least one thin film resistor structure is spaced from the least one active component region with a specific distance, wherein the at least one thin film resistor structure comprises a plurality of rectangular structures and each of the plurality of rectangular structures sequentially includes an oxide layer and a metal material layer located on the oxide layer, the plurality of rectangular structures includes a first strip resistor structure and a second strip resistor structure, the first and second strip resistor structures are parallel to each other and separate from each other, and the first and second strip resistor structures are electrically connected to each other through metal connection structures, and the metal connection structures are selected from at least two of the group consisting of a wiring structure, a plug and a conductor wire structure, wherein the active component region comprises at least one elongated strip gate structure, a long side of the thin film resistor structure is perpendicular to a long side of the at least one elongated gate structure. 13. The structure of claim 12 , wherein the plurality of rectangular structures further comprises a third strip resistor structure, the first, second and third strip resistor structures are parallel to one another and separate from one another, and the first, second and third strip resistor structures are electrically connected to one another through the metal connection structures, and the metal connection structures are selected from at

Assignees

Inventors

Classifications

  • Combinations of field-effect devices and one or more diodes, capacitors or resistors · CPC title

  • Combinations of BJTs and one or more of diodes, resistors or capacitors · CPC title

  • Resistors having no potential barriers · CPC title

  • H10D84/209Primary

    of only resistors · CPC title

  • Electricity · mapped topic

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Frequently asked questions

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What does patent US9401358B1 cover?
A semiconductor device structure having at least one thin-film resistor structure is provided. Through the metal plug(s) or metal wirings located on different layers, a plurality of stripe segments of the thin-film resistor structure is electrically connected to ensure the thin-film resistor structure with the predetermined resistance and less averting areas in the layout design.
Who is the assignee on this patent?
United Microelectronics Corp
What technology area does this patent fall under?
Primary CPC classification H10D84/209. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Jul 26 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (B1). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).