Sample plate using MALDI-TOF mass spectrometer and manufacturing method of the sample plate

Patent metadata

Field	Value
Publication number	US-9396918-B2
Application number	US-201414534335-A
Country	US
Kind code	B2
Filing date	Nov 6, 2014
Priority date	Nov 6, 2013
Publication date	Jul 19, 2016
Grant date	Jul 19, 2016

Abstract

A sample plate in use with a MALDI-TOF (matrix-assisted laser desorption ionization time-of-flight) mass spectrometer. The sample plate is usable for the mass spectrometry of a polymeric material on the order of several hundreds of Da and a method of manufacturing the same sample plate. The sample plate including a target plate, an organic matrix formed on one surface of the target plate, and a Parylene thin film formed on the target plate on which the organic matrix is formed, the Parylene thin film entirely covering the organic matrix.

First claim

What is claimed is:

1. A sample plate comprising:
a target plate;
an organic matrix formed on one surface of the target plate; and
a Parylene-N thin film formed on the target plate on which the organic matrix is formed, the Parylene-N thin film entirely covering the organic matrix.

2. The sample plate according to claim 1 , further comprising a subject to be analyzed formed on the Parylene-N thin film.

3. The sample plate according to claim 2 , wherein a molecular weight of the subject to be analyzed ranges from 100 to 1,000 Da.

4. The sample plate according to claim 1 , wherein the Parylene-N thin film comprises a deposition film having a thickness ranging from 10 to 100 nm.

5. The sample plate according to claim 1 , wherein the sample plate is to be in use with a MALDI-TOF mass spectrometer.

6. A method of manufacturing a sample plate comprising:
forming an organic matrix on one surface of a target plate; and
forming a Parylene-N thin film on the target plate on which the organic matrix is formed such that the Parylene-N thin film entirely covers the organic matrix.

7. The method according to claim 6 , further comprising forming a subject to be analyzed on the Parylene-N thin film.

8. The method according to claim 6 , wherein the Parylene-N thin film is deposited at a thickness ranging from 10 to 100 nm.

9. The method according to claim 6 , wherein forming the Parylene-N thin film comprises:
evaporating Parylene by heating a Parylene dimer;
forming an intermediate by pyrolyzing the evaporated Parylene dimer; and
introducing the intermediate into a deposition chamber, thereby depositing a Parylene-N thin film on the target plate on which the organic matrix is formed.

Assignees

• Univ Yonsei Iacf
• Univ Industry Foundation Uif Yonsei University

Inventors

• Pyun Jaechul
• Kim Jo Il

Classifications

• C08G2261/3424

  non-conjugated, e.g. paracyclophanes or xylenes · CPC title

• H01J49/0418 Primary

  for laser desorption, e.g. matrix-assisted laser desorption/ionisation [MALDI] plates or surface enhanced laser desorption/ionisation [SELDI] plates · CPC title

• H01J49/164

  Laser desorption/ionisation, e.g. matrix-assisted laser desorption/ionisation [MALDI] (sample holders H01J49/0418) · CPC title

• C08G61/025

  Polyxylylenes · CPC title