Method and system for dimensional analysis of an object

Patent metadata

Field	Value
Publication number	US-9351697-B2
Application number	US-201414196260-A
Country	US
Kind code	B2
Filing date	Mar 4, 2014
Priority date	Mar 4, 2014
Publication date	May 31, 2016
Grant date	May 31, 2016

Abstract

The invention relates generally to the measurement and dimensional analysis of an object and, more particularly, to the correction of distortion in volumetric data of the object using dimensional data of the object. In one embodiment, the invention provides a method of analyzing an object, the method comprising: acquiring volumetric data of an object using an X-ray computed tomography (CT) imaging system; acquiring dimensional data of the object using a vision-based system; determining whether the volumetric data include a distortion; and in the case that the volumetric data are determined to include a distortion, correcting the distortion in the volumetric data using the dimensional data.

First claim

What is claimed is:

1. A method of analyzing an object, the method comprising:
acquiring volumetric data of an object using an X-ray computed tomography (CT) imaging system;
acquiring dimensional data of the object using a vision-based system;
determining whether the volumetric data include a distortion; and
in the case that the volumetric data are determined to include a distortion, correcting the distortion in the volumetric data using the dimensional data.

2. The method of claim 1 , wherein the vision-based system includes at least one of the following: a structured light metrology device, a vision-based coordinate measurement machine, a machine vision system, a laser scanner, or a camera-based data collection system.

3. The method of claim 1 , further comprising:
constructing a point cloud using the dimensional data.

4. The method of claim 1 , wherein the distortion includes a distortion due to X-ray scatter.

5. The method of claim 1 , wherein the volumetric data include measurements of both external and internal surfaces of the object.

6. The method of claim 1 , wherein the acquiring steps are carried out simultaneously.

7. The method of claim 1 , wherein the acquiring steps are carried out sequentially.

8. The method of claim 1 , further comprising:
constructing a three-dimensional model of the object using the corrected volumetric data.

9. The method of claim 1 , further comprising:
in the case that the volumetric data are determined not to include a distortion, confirming the volumetric data using the dimensional data.

10. The method of claim 1 , wherein at least one of acquiring the volumetric data and acquiring the dimensional data includes rotating the object about an axis.

11. A system for analyzing an object, the system comprising:
an X-ray computed tomography (CT) imaging system; and
a vision-based system,
wherein the X-ray CT imaging system and the vision-based system are configured to simultaneously collect, respectively, volumetric data and dimensional data of an object.

12. The system of claim 11 , wherein the vision-based system includes at least one of the following: a structured light metrology device, a vision-based coordinate measurement machine, a machine vision system, a laser scanner, or a camera-based data collection system.

13. The system of claim 11 , further comprising:
a distortion correction system operable to correct a distortion in the volumetric data using the dimensional data.

14. The system of claim 13 , wherein the distortion is due to X-ray scatter.

15. The system of claim 13 , further comprising:
a three-dimensional modeling system for constructing a three-dimensional model of the object using corrected volumetric data.

16. A computer program product for correcting distortion in volumetric data of an object, the computer program product comprising a computer-readable storage medium having program code embodied therewith, the program code being executable by a computer processor to perform a method comprising:
comparing volumetric data of an object with dimensional data of the object; and
remapping the volumetric data using the dimensional data,
wherein the volumetric data include measurements of both external and internal surfaces of the object and the dimensional data include measurements of external surfaces of the object.

17. The computer program product of claim 16 , wherein the method further comprises:
constructing a point cloud using the dimensional data.

18. The computer program product of claim 17 , wherein remapping the volumetric data includes remapping the volumetric data to the point cloud.

19. The computer program product of claim 16 , wherein the method further comprises:
acquiring the volumetric data of the object using an X-ray computed tomography (CT) imaging system; and
acquiring the dimensional data of the object using a vision-based system.

20. The computer program product of claim 16 , wherein the method further comprises:
constructing a three-dimensional model of the object using the corrected volumetric data.

Assignees

• Gen Electric

Inventors

• Batzinger Thomas James
• Lewis Gareth William David
• Lomas Jonathan Matthew
• Thompson Christopher Edward
• Turan Birol

Classifications

• G01B21/045

  Correction of measurements (G01B9/02055 takes precedence) · CPC title

• G06T7/0002

  Inspection of images, e.g. flaw detection · CPC title

• A61B6/5258

  involving detection or reduction of artifacts or noise · CPC title

• G06T2207/10081

  Computed x-ray tomography [CT] · CPC title

• G06T7/0024

  Physics · mapped topic