Semiconductor memory apparatus

Patent metadata

Field	Value
Publication number	US-9349488-B2
Application number	US-201414495988-A
Country	US
Kind code	B2
Filing date	Sep 25, 2014
Priority date	May 13, 2014
Publication date	May 24, 2016
Grant date	May 24, 2016

Abstract

A semiconductor memory apparatus includes a plurality of data storage regions; a first internal circuit configured to input a plurality of control signals to the plurality of data storage regions; and a second internal circuit configured to control input timing of a test control signal, and input the test control signal to the plurality of data storage regions according to the controlled input timing in response to a test mode signal.

First claim

What is claimed is:

1. A semiconductor memory apparatus comprising:
a plurality of data storage regions;
a first internal circuit configured to input a plurality of control signals to the plurality of data storage regions; and
a second internal circuit configured to control input timing of a test control signal, and input the test control signal to the plurality of data storage regions according to the controlled input timing in response to a test mode signal,
wherein the first internal circuit includes a first interface directly coupled to an external controller and configured to receive the plurality of control signals from the external controller, and
wherein the second internal circuit includes a second interface directly coupled to an external test device, and configured to receive the test control signal from the external test device.

2. The semiconductor memory apparatus of claim 1 , wherein the second internal circuit comprises:
a delay control unit configured to control the input timing of the test control signal to be inputted to each of the plurality of data storage regions in response to the test mode signal.

3. The semiconductor memory apparatus of claim 2 , wherein the delay control unit inputs the test control signal to each of the plurality of data storage regions with different input timings in response to the test mode signal.

4. The semiconductor memory apparatus of claim 3 , wherein the delay control unit comprises:
a delay chain including a plurality of delay units serially coupled; and
a selection unit configured to select each output of the plurality of delay units, and output the selected output to each of the plurality of data storage regions in response to the test mode signal,
wherein the delay chain receives the test control signal.

5. The semiconductor memory apparatus of claim 2 , wherein the delay control unit is one of a synchronized delay control unit to work in synchronization with a clock, and a non-synchronized delay control unit to work without synchronization to the clock.

6. The semiconductor memory apparatus of claim 2 , wherein the delay control unit comprises:
a plurality of delay chains, each of which includes a plurality of serially coupled delay units; and
a plurality of selection units, each of which outputs an output of the plurality of delay units included in a corresponding one of the plurality of delay chains,
wherein the plurality of delay chains receive the test control signal.

7. A semiconductor memory apparatus comprising:
a plurality of data storage regions;
a normal signal transfer path configured to set operation modes to each of the plurality of data storage regions; and
a test signal transfer path configured to control the plurality of data storage regions to enable the plurality of data storage regions to perform operations with the same pattern while the plurality of data storage regions perform different operations to each other at the same time in a test mode,
wherein the normal signal transfer path includes a first interface directly coupled to an external controller, and
wherein the test signal transfer path includes a second interface directly coupled to an external test device.

8. The semiconductor memory apparatus of claim 7 , wherein the normal signal transfer path receives a plurality of control signals to individually set operation mode of each of the plurality of data storage regions from the external controller, and input the plurality of control signals to the plurality of data storage regions.

9. The semiconductor memory apparatus of claim 7 , wherein the test signal transfer path receives a test control signal to set an operation mode of the plurality of data storage regions from the external test device, delay the test control signal with different delay amounts for each of the plurality of data storage regions, and input the delayed test control signal to each of the plurality of data storage regions.

10. The semiconductor memory apparatus of claim 9 , wherein the test signal transfer path determines the delay amounts of the test control signal in response to a test mode signal.

11. The semiconductor memory apparatus of claim 10 , wherein the test signal transfer path comprises:
a plurality of delay units, which are serially coupled;
a selection unit configured to transfer an output of the plurality of delay units to one of the plurality of data storage regions in response to the test mode signal.

12. A semiconductor memory apparatus comprising a plurality of stacked semiconductor dies,
wherein one of the plurality of stacked semiconductor dies comprises:
a first interface electrically configured to individually set an operation mode of each of the plurality of stacked semiconductor dies under control of an external controller in a normal mode; and
a second interface configured to receive a test control signal from an external test device, delay the test control signal with different delay amounts for each of the plurality of stacked semiconductor dies, and input the delayed test control signal to each of the plurality of stacked semiconductor dies in a test mode,
wherein the first interface is directly coupled to the external controller, and the second interface is directly coupled to the external test device.

13. The semiconductor memory apparatus of claim 12 , wherein the second interface comprises:
a delay control unit configured to determine the delay amounts of the test control signal, and respectively input delayed test control signals having different delay amounts to the plurality of stacked semiconductor dies in response to a test mode signal.

14. The semiconductor memory apparatus of claim 13 , wherein the delay control unit comprises:
a delay chain including a plurality of delay units which are serially coupled and delay the test control signal; and
a selection unit configured to select each output of the plurality of serially coupled delay units, and output the selected output to each of the plurality of stacked semiconductor dies in response to the test mode signal.

15. The semiconductor memory apparatus of claim 12 , wherein each of the plurality of stacked semiconductor dies work through different channels.

Assignees

• Sk Hynix Inc

Inventors

• Lee Chang Hyun
• Ku Young Jun

Classifications

• G11C29/023

  in clock generator or timing circuitry · CPC title

• G11C2029/2602

  Concurrent test · CPC title

• G11C29/12

  Built-in arrangements for testing, e.g. built-in self testing [BIST] {or interconnection details} · CPC title

• G11C29/50012

  of timing · CPC title

• G11C29/56

  External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor · CPC title