Testing device, test system including the same, and method thereof

Patent metadata

Field	Value
Publication number	US-9329225-B2
Application number	US-201113310116-A
Country	US
Kind code	B2
Filing date	Dec 2, 2011
Priority date	Dec 10, 2010
Publication date	May 3, 2016
Grant date	May 3, 2016

Abstract

A testing device includes a signal sensing unit and a signal processing unit. The signal sensing unit generates a test output signal by sensing a signal from a device under test including a plurality of passive elements that are connected in parallel. The signal processing unit detects an open-type fault of the plurality of passive elements by measuring an impedance of the device under test based on element characteristic information of the plurality of passive elements.

First claim

What is claimed is:

1. A testing device, comprising:
a signal sensing unit configured to generate a test output signal by sensing a signal from a device under test, the device under test including a plurality of passive elements that are connected in parallel; and
a signal processing unit configured to measure an impedance of the device under test using the test output signal and to detect an open-type fault of the plurality of passive elements based on the measured impedance and element characteristic information of the plurality of passive elements,
wherein the impedance of the plurality of passive elements is calculated by selectively using a first signal path and a second signal path based on a frequency of the test output signal.

2. The testing device of claim 1 , wherein the signal processing unit comprises:
a signal conversion unit to convert the test output signal into a digital signal; and
a digital signal processing unit to determine whether a waveform of the digital signal is stabilized, and to detect, after the waveform of the digital signal is stabilized, the open-type fault of the plurality of passive elements based on the stabilized waveform of the digital signal and the element characteristic information.

3. The testing device of claim 2 , wherein the digital signal processing unit comprises:
a memory unit to store the digital signal; and
a waveform distortion measuring unit to determine whether the waveform of the digital signal is stabilized based on the digital signal stored in the memory unit.

4. The testing device of claim 2 , wherein the digital signal processing unit comprises:
a feature extracting unit to generate feature information based on the digital signal; and
a faulty element detecting unit to detect the open-type fault of the plurality of passive elements based on the feature information and the element characteristic information.

5. The testing device of claim 1 , wherein the plurality of passive elements includes capacitors, and
wherein the signal processing unit measures a total capacitance of the capacitors, compares the measured capacitance with a reference capacitance that is a total capacitance of the capacitors having no open-type fault, and determines which one of the capacitors has the open-type fault based on a difference of the measured capacitance and the reference capacitance, information about respective capacitances of the capacitors, and information about a number of the capacitors corresponding to each capacitance.

6. The testing device of claim 1 , wherein the signal sensing unit sequentially applies test voltages having different test frequencies to the device under test, and generates the test output signal by sensing the signal generated from the device under test in response to the test voltages.

7. The testing device of claim 1 , wherein the signal processing unit detects the open-type fault of the plurality of passive elements based on a frequency characteristic that an impedance of the plurality of passive elements changes according to a frequency of a test voltage applied to the plurality of passive elements.

8. The testing device of claim 1 , wherein the signal processing unit detects the open-type fault of the plurality of passive elements based on an error characteristic that an impedance of the plurality of passive elements changes according to a level of a test voltage applied to the plurality of passive elements.

9. The testing device of claim 1 , wherein the plurality of passive elements include resistors, and
wherein the signal processing unit compares a level of the test output signal with a reference level that is a level of the test output signal in a case where the resistors have no open-type fault, and determines which one of the resistors has the open-type fault based on a difference between the level of the test output signal and the reference level, information about respective resistances of the resistors according to a level of a test voltage applied to the device under test, and information about a number of the resistors corresponding to each resistance.

10. A testing device, comprising:
a signal sensing unit configured to generate a test output signal by sensing a signal from a device under test, the device under test including a plurality of passive elements that are connected in parallel; and
a signal processing unit configured to measure an impedance of the device under test using the test output signal and to detect an open-type fault of the plurality of passive elements based on the measured impedance and element characteristic information of the plurality of passive elements,
wherein the signal processing unit comprises:
a signal conversion unit to convert the test output signal into a digital signal; and
a digital signal processing unit to determine whether a waveform of the digital signal is stabilized, and to detect, after the waveform of the digital signal is stabilized, the open-type fault of the plurality of passive elements based on the stabilized waveform of the digital signal and the element characteristic information,
wherein the signal conversion unit performs an RMS-to-DC conversion on the test output signal in response to a frequency of the test output signal being higher than a threshold frequency, and
wherein the digital signal processing unit detects the open-type fault of the plurality of passive elements based on a result of the RMS-to-DC conversion.

11. A testing device, comprising:
a signal sensing unit configured to generate a test output signal by sensing a signal from a device under test, the device under test including a plurality of passive elements that are connected in parallel; and
a signal processing unit configured to measure an impedance of the device under test using the test output signal and to detect an open-type fault of the plurality of passive elements based on the measured impedance and element characteristic information of the plurality of passive elements,
wherein the signal processing unit comprises:
a signal conversion unit to convert the test output signal into a digital signal; and
a digital signal processing unit to determine whether a waveform of the digital signal is stabilized, and to detect, after the waveform of the digital signal is stabilized, the open-type fault of the plurality of passive elements based on the stabilized waveform of the digital signal and the element characteristic information, and
wherein the signal conversion unit comprises:
an RMS-to-DC converter disposed on a first signal path to convert an RMS value of the test output signal into a DC value;
a first analog-to-digital converter disposed on the first signal path to convert the DC value into the digital signal;
a second analog-to-digital converter disposed on a second signal path to convert the test output signal into the digital signal; and
a switch to selectively provide the first signal path or the second signal path with the test output signal received from the signal sensing unit.

12. The testing device of claim 11 , wherein the signal conversion unit converts the test output signal via the first signal path in response to a frequency of the test output signal being higher than a threshold frequency, and converts the test output signal via the second signal path in response to the frequency of the test output signal being equal to or lower than the threshold frequency.

Assignees

• Kim Yun-Cheol
• Lee Chang-Ho
• Choi Jin-Ho
• Kim Min-Woo
• Samsung Electronics Co Ltd

Inventors

• Kim Yun-Cheol
• Lee Chang-Ho
• Choi Jin-Ho
• Kim Min-Woo

Classifications

• G01R31/2813

  Checking the presence, location, orientation or value, e.g. resistance, of components or conductors (orientation of the DUT with respect to the test fixture G01R1/06705) · CPC title

• G01R31/2805

  Bare printed circuit boards · CPC title

• G01R31/2812 Primary

  Checking for open circuits or shorts, e.g. solder bridges; Testing conductivity, resistivity or impedance (of connections G01R31/66) · CPC title

• G01R31/2806

  Apparatus therefor, e.g. test stations, drivers, analysers, conveyors (G01R31/2805, G01R31/281, G01R31/2818 take precedence) · CPC title

• G01R27/02

  Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant (by measuring phase angle only G01R25/00) · CPC title