System and methods for use in monitoring a structure

Patent metadata

Field	Value
Publication number	US-9329021-B1
Application number	US-201313887592-A
Country	US
Kind code	B1
Filing date	May 6, 2013
Priority date	May 6, 2013
Publication date	May 3, 2016
Grant date	May 3, 2016

Abstract

A system for use in monitoring a structure is provided. The system includes a strip of piezoresistive material including nano-elements, electrodes coupled to the strip, and a resistance detector configured to measure a resistance of the strip.

First claim

What is claimed is:

1. A system for use in monitoring a structure, said system comprising:
a plurality of strips of piezoresistive material arranged in a grid-like configuration, each strip comprising a plurality of nano-elements randomly dispersed within a resin material;
electrodes coupled to each strip; and
a resistance detector configured to measure a resistance of each strip.

2. The system in accordance with claim 1 , wherein each strip comprises a plurality of carbon nano-elements randomly dispersed within the resin material.

3. The system in accordance with claim 1 , wherein each strip of piezoresistive material has a gauge factor of greater than about 1.

4. The system in accordance with claim 1 , wherein said resistance detector is configured to determine potential damage including at least one of an impact by a foreign object, delamination of layers used to form the structure, and micro-cracks in the structure.

5. The system in accordance with claim 1 , wherein said resistance detector is further configured to detect strain applied to each strip.

6. A method of monitoring a structure, said method comprising:
coupling a plurality of strips of piezoresistive material to the structure such that the plurality of strips are oriented in a grid-like configuration, each strip of piezoresistive material including a plurality of nano-elements randomly dispersed within a resin material;
inducing at least one of voltage and current to each strip; and
measuring a resistance of each strip as the at least one of voltage and current is applied thereto, wherein a change in the resistance determines potential damage to the structure.

7. The method in accordance with claim 6 further comprising:
locating the potential damage based on a change in the resistance of the plurality of strips, wherein strips located proximate to the potential damage have a greater change in resistance than strips located away from the potential damage.

8. The method in accordance with claim 6 , wherein coupling a plurality of grips comprises coupling at least one strip to an outer surface of the structure.

9. The method in accordance with claim 6 , wherein coupling a plurality of strips comprises coupling at least one strip between layers of material used to form the structure.

10. The method in accordance with claim 6 , wherein measuring a resistance comprises comparing the resistance to a baseline resistance of each strip, wherein a permanent change between the resistance and the baseline resistance determines damage to the structure.

11. The method in accordance with claim 6 , wherein measuring a resistance comprises determining potential damage including at least one of an impact by a foreign object, delamination of layers used to form the structure, and micro-cracks in the structure.

Assignees

• Boeing Co
• Univ Delaware

Inventors

• Deluca Michael J
• Felker Christopher J
• Heider Dirk
• Pandey Gaurav
• Abu-Obaid Ahmad
• Thostenson Erik T
• Gillespie Jr John W

Classifications

• G01B7/18 Primary

  using change in resistance · CPC title

• G01M5/0033 Primary

  by determining damage, crack or wear · CPC title

• B82Y15/00

  Nanotechnology for interacting, sensing or actuating, e.g. quantum dots as markers in protein assays or molecular motors · CPC title

• G01M5/0083

  by measuring variation of impedance, e.g. resistance, capacitance, induction · CPC title