X-ray inspection device

Patent metadata

Field	Value
Publication number	US-9322790-B2
Application number	US-201214371678-A
Country	US
Kind code	B2
Filing date	Jun 27, 2012
Priority date	Jan 12, 2012
Publication date	Apr 26, 2016
Grant date	Apr 26, 2016

Abstract

Provided is an X-ray inspection device having a pair of conveyor frames that is disposed symmetrically with respect to a center line as an axis along a substrate conveying direction, and clamps a printed substrate in a substrate width direction. A substrate conveying mechanism conveys in an X axis direction the printed substrate supported by the conveyor frames. A distance adjustment mechanism drives the pair of conveyor frames so that the conveyor frames approach or depart from each other in the Y axis direction, thereby adjusting the width dimension of a printed substrate that can be conveyed by the substrate conveying mechanism disposed on each of the conveyor frames.

First claim

The invention claimed is:

1. An X-ray inspection device that is used on a conveyance path for conveying a printed substrate in a predetermined substrate conveying direction, comprising:
a substrate table configured to hold the printed substrate;
an X-ray source configured to irradiate X-rays onto the printed substrate held on the substrate table;
an X-ray camera unit facing the X-ray source across the substrate table, the X-ray camera unit includes an X-ray camera that captures an X-ray image of the printed substrate held on the substrate table, the X-ray camera unit enabling the X-ray camera to move along a plane relative to the X-ray source so as to execute an oblique view capturing taken by diagonally capturing an essential inspection area, upon irradiating X-rays at a predetermined elevation angle onto the substrate;
a frame forming a main body of the substrate table, the frame having an opening to transmit X-rays;
a pair of conveyor frames configured to clamp the printed substrate with respect to a substrate width direction which is orthogonal to the substrate conveying direction in a horizontal plane;
a pair of substrate conveyors, each substrate conveyor being disposed on a respective pair of the conveyor frames, the pair of substrate conveyors forming a substrate conveying mechanism configured to convey a printed substrate supported by the pair of conveyor frames in the substrate conveying direction;
a distance adjustment mechanism configured to drive the pair of conveyor frames so that each of the pair of conveyor frames approaches or departs from each other in the substrate width direction, thereby adjusting a width dimension for allowing a printed substrate to be conveyed by the substrate conveying mechanism;
a movable frame being disposed on a lower surface of the frame; and
a table driving mechanism including the movable frame, the table driving mechanism being configured to drive the substrate table via the movable frame in a horizontal direction that is orthogonal to the substrate conveying direction, wherein
the distance adjustment mechanism is configured to drive the pair of conveyor frames such that the conveyor frames equally approach or depart from each other,
the pair of conveyor frames is disposed on the frame symmetrically with respect to a center axis of the opening along the substrate conveying direction, and
the movable frame has a frame structure of which a center is open similarly to the frame, and
each of the pair of conveyor frames has a facing edge that the conveyor frame faces in the substrate width direction, and a bevel, which inclines such that a downstream side in an X-ray irradiation direction of the X-ray irradiation unit is wider, and is formed on the facing edge.

2. The X-ray inspection device according to claim 1 , wherein
the frame has four sides forming the opening of a square in planar view, and, out of the four sides, at least sides along the substrate conveying direction have a bevel inclining such that a downstream side in an X-ray irradiation direction of the X-ray irradiation unit is wider.

3. The X-ray inspection device according to claim 1 , wherein
the distance adjustment mechanism includes:
double-end studs extending in the substrate width direction, screw directions of each double-ends stud at one end and at the other end being set to be opposite;
a first nut mechanism installed in one of the conveyor frames, the first nut mechanism being screwed into one end of the double-end studs;
a second nut mechanism installed in the other conveyor frame, the second nut mechanism being screwed into other end of the double-end studs;
a motor configured to drive the double-end studs; and
a power transfer unit configured to transfer power of the motor to both the double-end studs in a same direction at a same speed.

4. The X-ray inspection device according to claim 1 , wherein
the substrate conveying mechanism further includes a conveyor driving mechanism configured to drive the pair of substrate conveyors,
the conveyor driving mechanism includes a motor, a drive shaft rotary-driven by the motor, and a first output pulley and a second output pulley connected to the drive shaft, and
the first output pulley and the second output pulley are connected with the drive shaft such that rotation of the first output pulley and the second output pulley is restricted and the first output pulley and the second output pulley are movable with respect to an axis direction of the drive shaft, the first output pulley transferring power to one of the substrate conveyors and the second output pulley transferring power to the other substrate conveyor.

Assignees

• Ookawa Naonobu
• Yamaha Motor Co Ltd

Inventors

• Ookawa Naonobu

Classifications

• G01N2223/6113

  printed circuit board [PCB] · CPC title

• H05K2203/163

  Monitoring a manufacturing process · CPC title

• G01N23/043 Primary

  using fluoroscopic examination, with visual observation or video transmission of fluoroscopic images · CPC title

• H05K13/08

  Monitoring manufacture of assemblages · CPC title

• G01N23/04 Primary

  and forming images of the material · CPC title