Process and system for calibrating a first loop feature value estimation method using a first locally measurable loop characteristic and a first set of parameters

Patent metadata

Field	Value
Publication number	US-9316715-B2
Application number	US-201113995303-A
Country	US
Kind code	B2
Filing date	Dec 21, 2011
Priority date	Jan 3, 2011
Publication date	Apr 19, 2016
Grant date	Apr 19, 2016

Abstract

A process for calibrating a first loop feature value estimation method using a first locally measurable loop characteristic and a first set of parameters, includes taking measurements of the first locally measurable loop characteristic for a plurality of loops, and obtaining a reference data set representing reference estimates of the loop feature value. The reference estimates are obtained by performing a calibrated second loop feature value estimation method using a second locally measurable loop characteristic and a second set of parameters. The method further includes determining calibrated parameters so as to minimize a deviation between the reference estimates and estimates obtained by applying the first estimation method to the measurements using the calibrated parameters as the first set of parameters.

First claim

The invention claimed is:

1. A calibration process for calibrating a first loop feature value estimation method using a first locally measurable loop characteristic and a first set of parameters, comprising:
taking measurements of said first locally measurable loop characteristic for a first plurality of loops;
obtaining a reference data set representing reference estimates of said loop feature value, said reference estimates being obtained by performing a calibrated second loop feature value estimation method using a second locally measurable loop characteristic and a second set of parameters, the first loop feature value estimation method and the second loop feature value estimation method being different methods; and
determining calibrated parameters so as to minimize a deviation between said reference estimates and estimates that can be obtained by applying said first loop feature value estimation method to said measurements using said calibrated parameters as said first set of parameters.

2. The calibration process according to claim 1 , further comprising obtaining a verification data set representing verification estimates of feature values of said first plurality of loops, said verification estimates being obtained by applying said first loop feature value estimation method to said measurements using uncalibrated parameters as said first set of parameters, wherein said determining of said calibrated parameters comprises updating said calibrated parameters so as to minimize a deviation between said verification estimates and said reference estimates.

3. The calibration process according to claim 1 , wherein said obtaining said reference data set comprises:
measuring feature values of a second plurality of loops; and
determining said second set of parameters so as to minimize a deviation between said feature values of said second plurality and estimates of said feature values obtained by performing said second loop feature value estimation method;
wherein the electrical properties of said second plurality of loops are substantially representative of the electrical properties of said first plurality of loops.

4. The calibration process according to claim 3 , wherein said second plurality of loops is a subset of said first plurality of loops.

5. The calibration process according to claim 1 , wherein said first loop feature value estimation method or said second loop feature value estimation method comprises a MELT method.

6. The calibration process according to claim 5 , wherein said MELT method uses a parameter set including a lineic differential capacitance and a lineic common-mode capacitance.

7. The calibration process according to claim 1 , wherein said first loop feature value estimation method or said second loop feature value estimation method comprises a SELT method.

8. The calibration process according to claim 7 , wherein said SELT method uses a parameter set including a lineic serial resistance, a lineic serial inductance, a lineic parallel conductance, and a lineic parallel capacitance.

9. The calibration process according to claim 1 , wherein said loop feature comprises a loop length.

10. Computer program product comprising processor-executable instructions which, when executed, perform the calibration process of claim 1 .

11. System for calibrating a first loop feature value estimation method using a first locally measurable loop characteristic and a first set of parameters, comprising:
a first measurement device for measuring a first locally measurable physical characteristic;
a first loop feature value estimation processor, operatively connected to said first measurement device and to a first parameter memory, said first loop feature value estimation processor being adapted to produce a first loop feature value estimate by means of a first loop feature value estimation method on the basis of said first measurable physical characteristic and a first parameter set contained in said first parameter memory;
a second measurement device for measuring a second locally measurable physical characteristic;
a second loop feature value estimation processor, operatively connected to said second measurement device and to a second parameter memory, said second loop feature value estimation processor being adapted to produce a second loop feature value estimate by means of a second loop feature value estimation method on the basis of said second measurable physical characteristic and a second parameter set contained in said second parameter memory, the first loop feature value estimation method and the second loop feature value estimation method being different methods; and
means for using said first loop feature value estimate and said second loop feature value estimate to update said first parameter set such that loop feature value estimates subsequently obtained by said first loop feature value estimation processor substantially coincide with loop feature value estimates obtained by said second loop feature value estimation processor.

12. The system according to claim 11 , wherein said first loop feature value estimation method or said second loop feature value estimation method comprises a MELT method.

13. The system according to claim 12 , wherein said MELT method uses a parameter set including a lineic differential capacitance and a lineic common-mode capacitance.

14. The system according to claim 11 , wherein said first loop feature value estimation method or said second loop feature value estimation method comprises a SELT method.

15. The system according to claim 12 , wherein said SELT method uses parameter set including a lineic serial resistance, a lineic serial inductance, a lineic parallel conductance, and a lineic parallel capacitance.

16. The calibration process of claim 1 , wherein the first loop feature value estimation method is a MELT method and the second loop feature value estimation method is a SELT method.

17. The calibration process of claim 1 , wherein the first loop feature value estimation method is a SELT method and the second loop feature value estimation method is a MELT method.

18. The system of claim 11 , wherein the first loop feature value estimation method is a MELT method and the second loop feature value estimation method is a SELT method.

19. The system of claim 11 , wherein the first loop feature value estimation method is a SELT method and the second loop feature value estimation method is a MELT method.

Assignees

• Dupuis Nicolas
• Drooghaag Benoit
• Alcatel Lucent

Inventors

• Dupuis Nicolas
• Drooghaag Benoit

Classifications

• G01R35/007 Primary

  Standards or reference devices, e.g. voltage or resistance standards, "golden references" · CPC title

• H04B3/466 Primary

  Testing attenuation in combination with at least one of group delay and phase shift · CPC title

• G01R35/00 Primary

  Testing or calibrating of apparatus covered by the other groups of this subclass · CPC title

• H04B3/46

  Monitoring; Testing · CPC title