Measuring device, a calibration device, a measuring system and a method with a dynamic data sheet

Patent metadata

Field	Value
Publication number	US-9454510-B2
Application number	US-201313871677-A
Country	US
Kind code	B2
Filing date	Apr 26, 2013
Priority date	Apr 27, 2012
Publication date	Sep 27, 2016
Grant date	Sep 27, 2016

Abstract

A measuring device including a signal-processing device, a processor for controlling the measuring device and a communications device. The signal-processing device and the communications device are each connected to the processor. The measuring device further includes a calibration-parameter store connected to the processor for the storage of calibration parameters. The processor is configured to communicate calibration parameters, which are stored in the calibration-parameter store, to a calibration device using the communications device and to implement calibration measurements using the signal-processing device.

First claim

We claim:

1. A measuring system comprising:
a measuring device and a separate calibration device, wherein:
the measuring device comprises a signal-processing device, a processor for controlling the measuring device and a communications device,
the signal-processing device of the measuring device and the communications device of the device are each connected to the processor of the measuring device,
the measuring device comprises a calibration-parameter store connected to the processor of the measuring device for the storage of calibration parameters,
the processor of the measuring device is embodied to communicate calibration parameters, which are stored in the calibration-parameter store, to the calibration device using the communications device of the measuring device and to implement calibration measurements using the signal-processing device of the measuring device,
the calibration device comprises a signal-processing device, a communications device, a processor for controlling the calibration device, and a DUT store,
the DUT store, the signal-processing device of the measuring device and the communications device of the measuring device are connected to the processor of the measuring device, and
the processor of the measuring device is embodied to receive calibration parameters from the measuring device to be calibrated using the communications device of the calibration device and to store them in the DUT store, and, using the signal-processing of the calibration device, to implement calibration measurements on the measuring device on the basis of the calibration parameters.

2. The measuring system according to claim 1 , wherein the measuring device is connected to the calibration device using the signal-processing device of the measuring device and using the communications device of the measuring device.

3. The measuring system according to claim 1 , wherein the processor of the measuring device transmits results of the calibration measurements to the calibration device using the communications device of the measuring device.

4. The measuring system according to claim 1 , wherein the communications device of the measuring device is embodied to communicate with the calibration device using a standardized protocol, and wherein the measuring device is embodied to be controlled from the calibration device using the standardized protocol.

5. The measuring system according to claim 4 , wherein the standardized protocol comprises SCPI.

6. The measuring system according to claim 1 , wherein the measuring device is embodied to generate the calibration parameters automatically on the basis of a device hardware, a device software and/or a device firmware.

7. The measuring system according to claim 1 , wherein the processor of the calibration device is embodied to implement calibration measurements on the measuring device on the basis of the calibration parameters, and/or to receive results from calibration measurements, which have been implemented by the measuring device to be calibrated, using the communications device of the calibration device.

8. The measuring system according to claim 1 , wherein the processor of the calibration device is embodied to implement a comparison of results of the calibration measurements with the calibration parameters, and to determine on the basis of the comparison a capability of the measuring device to be calibrated.

9. The measuring system according to claim 1 , wherein the communications device of the calibration device is embodied to communicate with the measuring device to be calibrated using a standardized protocol, and wherein the processor of the calibration device is embodied to control the measuring device to be calibrated using the standardized protocol using the communications device of the calibration device.

10. The measuring system according to claim 9 , wherein the standardized protocol comprises SCPI.

11. A method for operating the measuring system according to claim 1 , comprising the steps of:
reading by the calibration device of calibration parameters of the measuring device from the calibration-parameter store of the measuring device;
implementation of calibration measurements on the basis of the calibration parameters read by the measuring device and/or the calibration device; and
determination of the capability of the measuring device on the basis of a comparison of results of the calibration measurements and the calibration parameters.

12. The method according to claim 11 , further comprising the steps following performed before the reading of the calibration parameters:
determination of calibration parameters;
transmission of the calibration parameters to the measuring device, and
storage of the calibration parameters by the measuring device.

13. The method according to claim 11 , whereby the calibration parameters are generated automatically on the basis of a device hardware and/or a device software and/or a device firmware.

14. The method according to claim 11 , whereby the calibration parameters are generated in a standardized form or converted into a standardized form after they have been generated.

Assignees

• Rohde & Schwarz

Inventors

• Braunstorfinger Thomas

Classifications

• G01R35/007

  Standards or reference devices, e.g. voltage or resistance standards, "golden references" · CPC title

• G01D18/008 Primary

  with calibration coefficients stored in memory · CPC title

• G01R35/005

  Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references (G01R33/0035, G01R35/002 take precedence) · CPC title

• G06F17/00 Primary

  Digital computing or data processing equipment or methods, specially adapted for specific functions (information retrieval, database structures or file system structures therefor G06F16/00) · CPC title