Vertical hall effect sensor

Patent metadata

Field	Value
Publication number	US-9312473-B2
Application number	US-201314041063-A
Country	US
Kind code	B2
Filing date	Sep 30, 2013
Priority date	Sep 30, 2013
Publication date	Apr 12, 2016
Grant date	Apr 12, 2016

Abstract

In one aspect, a vertical Hall effect sensor includes a semiconductor wafer having a first conductivity type and a plurality of semiconductive electrodes disposed on the semiconductor wafer. The plurality of semiconductive electrodes have the first conductivity type and include a source electrode, a first sensing electrode and a second sensing electrode, arranged such that the source electrode is between the first sensing electrode and the sensing electrode and a first drain electrode and a second drain electrode, arranged such that the first sensing electrode, second sensing electrode, and source electrode are between the first drain electrode and the second drain electrode. The vertical Hall effect sensor also includes a plurality of semiconductor fingers disposed on the semiconductor wafer and interdigitated with the plurality of semiconductive electrodes, the semiconductor fingers having a second conductivity type.

First claim

What is claimed is:

1. A vertical Hall effect sensor comprising:
a semiconductor wafer having a first conductivity type;
a plurality of semiconductive electrodes disposed on the semiconductor wafer, the plurality of semiconductive electrodes having the first conductivity type, comprising:
a source electrode;
a first sensing electrode and a second sensing electrode, arranged such that the source electrode is between the first sensing electrode and the second sensing electrode; and
a first drain electrode and a second drain electrode, arranged such that the first sensing electrode, second sensing electrode, and source electrode are between the first drain electrode and the second drain electrode; and

a plurality of semiconductor fingers disposed on the semiconductor wafer and interdigitated with the plurality of semiconductive electrodes, the semiconductor fingers having a second conductivity type,
wherein the plurality of semiconductor fingers interdigitated with the plurality of semiconductive electrodes comprises a first semiconductor finger of the plurality of semiconductor fingers disposed between the source electrode and the first sensing electrode.

2. The sensor of claim 1 , wherein the semiconductor fingers are between one-tenth and two-tenths of the thickness of the semiconductor wafer.

3. The sensor of claim 1 , wherein the semiconductor fingers are electrically floated.

4. The sensor of claim 1 , further comprising at least one semiconductor blanket disposed at a first depth below at least one of the plurality of semiconductor electrodes in the semiconductor wafer.

5. The sensor of claim 4 , wherein the first depth is less than a depth of depletion regions beneath the semiconductor fingers.

6. The sensor of claim 4 , wherein the semiconductor blanket includes phosphorous-doped silicon.

7. The sensor of claim 4 , wherein the semiconductor blanket has a higher charge carrier density than an epitaxial portion of the semiconductor wafer.

8. The sensor of claim 1 , wherein a carrier density of the semiconductor wafer increases with distance from the semiconductor electrodes.

9. The sensor of claim 1 , wherein the plurality of semiconductor fingers interdigitated with the plurality of semiconductive electrodes further comprises a second semiconductor finger of the plurality of semiconductor fingers disposed between the source electrode and the second sensing electrode.

Assignees

• Allegro Microsystems Llc

Inventors

• Kosier Steven
• Hoilien Noel

Classifications

• H01L43/065 Primary

  Electricity · mapped topic

• G01R33/077 Primary

  Vertical Hall-effect devices · CPC title

• H01L43/14

  Electricity · mapped topic

• H01L27/22

  Electricity · mapped topic

• H10N59/00

  Integrated devices, or assemblies of multiple devices, comprising at least one galvanomagnetic or Hall-effect element covered by groups H10N50/00 - H10N52/00 (MRAM devices H10B61/00) · CPC title