Test probe alignment structures for radio-frequency test systems

Patent metadata

Field	Value
Publication number	US-9285419-B2
Application number	US-201113173387-A
Country	US
Kind code	B2
Filing date	Jun 30, 2011
Priority date	Jun 30, 2011
Publication date	Mar 15, 2016
Grant date	Mar 15, 2016

Abstract

Electronic devices may be tested using a test station with a test fixture. The test fixture may include a first holding structure in which a device under test may be placed and a second holding structure for supporting test probes. The second holding structure may be mated with a test probe alignment structure during test station setup operations. The test probe alignment structure may include registration features configured to set the relative position of the first and second holding structures to a known configuration and may include test probe alignment features that can be used to correctly position the placement of the test probes. If at least one of the test probes is not sufficiently aligned to its corresponding alignment feature, the test probe alignment structures will not be able to engage properly with the second holding structure, and the position of the problematic test probe may be adjusted accordingly.

First claim

What is claimed is:

1. A method for configuring at least one test probe that is located at an adjustable position within a test fixture in a radio-frequency test station, comprising:
placing a test probe alignment structure into alignment with the test fixture; and
while the test probe alignment structure and the test fixture are aligned, adjusting the position of the test probe with respect to the test fixture and the test probe alignment structure so that the test probe aligns with at least one corresponding test probe alignment feature in the test probe alignment structure, wherein adjusting the position of the test probe with respect to the test fixture and the test probe alignment structure so that the test probe aligns with at least one corresponding test probe alignment feature in the test probe alignment structure comprises moving the test probe horizontally within a test probe adjustment region, with respect to the test fixture and the test probe alignment structure, so that the test probe protrudes vertically into the at least one corresponding test probe alignment feature in the test probe alignment structure.

2. The method defined in claim 1 wherein placing the test probe alignment structure into alignment with the test fixture comprises registering the test probe alignment structure with the test fixture using mating registration features in the test probe alignment structure and the test fixture.

3. The method defined in claim 2 further comprising:
following adjustment of the test probe into alignment with the at least one corresponding test probe alignment feature, securing the test probe to the test fixture using an attachment mechanism selected from the group consisting of: welds, screws, clamps, levers, adhesive, and solder.

4. The method defined in claim 2 wherein a first portion of the mating registration features in the test fixture comprises at least one protruding member, wherein a first portion of the mating registration features in the test probe alignment structure comprises at least one corresponding recess, and wherein registering the test probe alignment structure with the test fixture comprises mating the at least one protruding member of the test fixture with the at least one corresponding recess in the test probe alignment structure.

5. The method defined in claim 4 wherein a second portion of the mating registration features in the test fixture comprises at least one recess, wherein a second portion of the mating registration features in the test probe alignment structure comprises at least one corresponding protruding member, and wherein registering the test probe alignment structure with the test fixture further comprises mating the at least one recess of the test fixture with the at least one corresponding protruding member in the test probe alignment structure.

6. The method defined in claim 2 wherein a portion of the mating registration features in the test fixture comprises at least one recess, wherein a portion of the mating registration features in the test probe alignment structure comprises at least one corresponding protruding member, and wherein registering the test probe alignment structure with the test fixture further comprises mating the at least one recess of the test fixture with the at least one corresponding protruding member in the test probe alignment structure.

7. The method defined in claim 1 wherein the at least one corresponding test probe alignment feature comprises a recess within a block of material, and wherein adjusting the position of the test probe within the test fixture so that the probe aligns with the at least one corresponding test probe alignment feature in the test probe alignment structure comprises adjusting the position of the test probe until the test probe is aligned with the recess within the block of material.

8. A method for determining whether a radio-frequency test probe is located at a proper position within a test fixture, wherein the test fixture includes registration features corresponding to registration features in a test probe alignment structure, comprising:
attempting to mate the test probe with a test probe alignment feature in the test probe alignment structure while mating the registration features of the test fixture with the registration features of the test probe alignment structure;
following an unsuccessful attempt at mating the test probe with the test probe alignment feature while mating the registration features of the test fixture with the registration features of the test probe alignment structure, adjusting where the test probe is positioned with respect to the test fixture and the test probe alignment structure;
following successful mating of the test probe with the test probe alignment feature while mating the registration features of the test fixture with the registration features of the test probe alignment structure, removing the test probe alignment structure from the test fixture;
inserting at least a given one of the registration features of the test fixture through an opening in a device under test; and
while the given one of the registration features is within the opening of the device under test, testing the device under test using the radio-frequency test probe.

9. The method defined in claim 8 wherein adjusting where the test probe is positioned with respect to the test fixture and the test probe alignment structure comprises adjusting the test probe to the proper position within the test fixture so that the test probe is in alignment with the test probe alignment feature.

10. The method defined in claim 9 further comprising:
following adjustment of the test probe into alignment with the test probe alignment feature, securing the test probe to the test fixture such that the test probe does not move with respect to the test fixture using an attachment mechanism selected from the group consisting of: welds, screws, clamps, levers, adhesive, and solder.

Assignees

• Nickel Joshua G
• Shen Jr-Yi
• Apple Inc

Inventors

• Nickel Joshua G
• Shen Jr-Yi

Classifications

• G01R31/3025

  Wireless interface with the DUT · CPC title

• G01R31/2891 Primary

  related to sensing or controlling of force, position, temperature (G01R31/2874 takes precedence; sensing of force G01L; sensing of position G01B, G01D; sensing of temperature G01K; controlling in general G05) · CPC title

• G01R29/10

  Radiation diagrams of antennas · CPC title

• H04B17/0045

  Electricity · mapped topic

• H04B17/0032

  Electricity · mapped topic