Packages with electrical fuses
US-2024332243-A1 · Oct 3, 2024 · US
US9271390B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9271390-B2 |
| Application number | US-201414332372-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jul 15, 2014 |
| Priority date | Jul 15, 2014 |
| Publication date | Feb 23, 2016 |
| Grant date | Feb 23, 2016 |
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Official abstract text for this publication.
A semiconductor device has a multi-wire lead and a die having a multi-site bond pad. A shielding wire and a guarded wire both extend from the multi-wire lead to the multi-site bond pad. The shielding wire (or wires) provide active shielding to the guarded wire by simultaneously transmitting the same signal as the guarded wire between the multi-wire lead the multi-site bond pad.
Opening claim text (preview).
The invention claimed is: 1. A semiconductor device, comprising: a die having a multi-site bond pad; a multi-wire lead; at least one shielding wire extending from the multi-wire lead to the multi-site bond pad; and a guarded wire extending from the multi-wire lead to the multi-site bond pad, wherein the at least one shielding wire and the guarded wire simultaneously transmit the same signals between the multi-site bond pad and the multi-wire lead. 2. The semiconductor device of claim 1 , wherein the multi-wire lead is “T” shaped. 3. The semiconductor device of claim 2 , wherein the at least one shielding wire comprises two shielding wires extending from the multi-wire lead to the multi-site bond pad. 4. The semiconductor device of claim 3 , wherein the two shielding wires extend between the multi-wire lead and the multi-site bond pad on opposite sides of the guarded wire. 5. The semiconductor device of claim 1 , wherein the multi-site bond pad has at least one shielding-wire bond-pad site and a guarded-wire bond-pad site. 6. The semiconductor device of claim 5 , wherein the multi-site bond pad has two shielding-wire bond-pad sites each located on opposite sides of the guarded-wire bond-pad site. 7. The semiconductor device of claim 5 , wherein the at least one shielding-wire bond-pad site and the guarded-wire bond-pad site are physically connected to one another without having impedance therebetween. 8. The semiconductor device of claim 1 , wherein the semiconductor device is a low-profile quad flat package. 9. The semiconductor device of claim 1 , wherein the signals are neither power nor ground voltage. 10. The semiconductor device of claim 1 , wherein the multi-site bond pad comprises at least one shielding-wire sub-bond-pad that has the shielding wire bonded thereto, and a guarded-wire sub-bond-pad that has the guarded wire bonded thereto, wherein the shielding-wire sub-bond-pad and the guarded-wire sub-bond-pad are physically connected to one another without having impedance therebetween. 11. The semiconductor device of claim 10 , wherein the at least one shielding-wire sub-bond-pad comprises two shielding-wire sub-bond-pads respectively located on opposite sides of the guarded-wire sub-bond-pad, and wherein the at least one shielding wire comprises two shielding wires respectively extending from the multi-wire lead to the two shielding-wire sub-bond-pads such that the two shielding wires are generally parallel to and on opposing sides of the guarded wire.
between a chip and a stacked lead frame, conducting package substrate or heat sink · CPC title
Top-view layouts, e.g. mirror arrays · CPC title
changes in dispositions · CPC title
multiple bond wires connected to a common bond pad · CPC title
Plan-view shape, i.e. in top view · CPC title
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