Capacitance evaluation apparatuses and methods

Patent metadata

Field	Value
Publication number	US-9267980-B2
Application number	US-201113210264-A
Country	US
Kind code	B2
Filing date	Aug 15, 2011
Priority date	Aug 15, 2011
Publication date	Feb 23, 2016
Grant date	Feb 23, 2016

Abstract

Apparatus and methods for evaluating leakage currents of capacitances are described. Capacitances having excessive leakage currents may be disabled from use. An example apparatus includes a leakage detection circuit configured to be coupled to a capacitance block. The leakage detection circuit is configured to determine whether a leakage current of a capacitance of the capacitance block exceeds a current limit and is further configured to provide an output indicative of a status of the capacitance. A detection controller is coupled to the leakage detection circuit and a register, and the detection controller is configured to store data in the register indicative of the status of the capacitance based at least in part on the signal from the leakage detection circuit.

First claim

What is claimed is:

1. An apparatus, comprising:
a leakage detection circuit configured to be coupled to a capacitance block, the leakage detection circuit configured to determine whether a leakage current of a capacitance of the capacitance block exceeds a reference current and further configured to provide an output indicative of a status of the capacitance, the leakage detection circuit including an output circuit having an input node and an output node, the output circuit configured to receive both the leakage and reference currents at the same input node, and based at least in part on the leakage and reference currents provide the output from the output node having a logic level indicative of whether the leakage current exceeds the reference current;
a register; and
a controller coupled to the leakage detection circuit and the register, the controller configured to store data in the register indicative of the status of the capacitance based at least in part on the output from the leakage detection circuit.

2. The apparatus of claim 1 wherein the leakage detection circuit comprises:
a measurement circuit configured to be coupled to the capacitance and further configured to apply a test voltage to the capacitance and provide the leakage current; and
a reference circuit configured to provide a reference current.

3. The apparatus of claim 2 wherein the reference circuit comprises a current mirror configured to receive the reference current and mirror the same to the output circuit.

4. The apparatus of claim 2 wherein the measurement circuit comprises:
measurement circuit configured to provide the test voltage to the capacitance and to provide a resultant leakage current; and
a current mirror coupled to the measurement circuit and configured to mirror the resultant leakage current as the leakage current.

5. The apparatus of claim 4 wherein the measurement circuit comprises
a negative feedback configured amplifier configured to be coupled to a test voltage supply and further configured to provide an output voltage responsive to a bias voltage provided to a negative input and a voltage provided to a positive input;
a first transistor coupled to the negative feedback configured amplifier and configured to be coupled to the test voltage supply, the first transistor configured to couple the capacitance and the positive voltage input to the bias voltage supply responsive to the output voltage of the negative feedback configured amplifier; and
a second transistor coupled to the negative feedback configured amplifier and configured to be coupled to the test voltage supply, the second transistor having substantially similar transistor characteristics as the first transistor and configured to provide the resultant leakage current to the current mirror responsive to the output voltage of the negative feedback configured amplifier.

6. The apparatus of claim 2 wherein the output circuit comprises an inverter.

Assignees

• Guo Xinwei
• Esteves James I
• Muralidharan Arvind
• Hendrickson Nicholas
• Micron Technology Inc

Inventors

• Guo Xinwei
• Esteves James I
• Muralidharan Arvind
• Hendrickson Nicholas

Classifications

• G01R31/64

  Testing of capacitors · CPC title

• G11C29/02 Primary

  Detection or location of defective auxiliary circuits, e.g. defective refresh counters · CPC title

• G11C29/025

  in signal lines · CPC title

• G11C2029/5006

  Current · CPC title

• G11C29/50016

  of retention · CPC title