Ion generation in mass spectrometers by cluster bombardment

US9263223B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9263223-B2
Application numberUS-201313870166-A
CountryUS
Kind codeB2
Filing dateApr 25, 2013
Priority dateApr 25, 2012
Publication dateFeb 16, 2016
Grant dateFeb 16, 2016

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Abstract

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The invention relates to devices and methods in mass spectrometers for the generation of ions of heavy molecules, especially biomolecules, by bombarding them with uncharged clusters of molecules. The analyte ions which are generated or released by cluster bombardment of analyte substances on the surface of sample support plates show a broad distribution of their kinetic energies, which prevents good ion-optical focusing. In the invention, the kinetic energies are homogenized in a higher-density collision gas. The collision gas is preferably located in an RF ion guide, more preferably an RF ion funnel, which can transfer the ions to the mass analyzer. The collision gas may be introduced with temporal pulsing, coordinated or synchronized with the pulsed supersonic gas jet. The collision gas may be pumped off again before the next supersonic gas pulse. In an advantageous embodiment, the collision gas can originate from the supersonic gas jet itself.

First claim

Opening claim text (preview).

The invention claimed is: 1. A method for generating analyte ions comprising: subjecting analyte substances on a sample support of an ion source of a mass spectrometer to a pulsed bombardment with uncharged molecular clusters to produce analyte ions; and homogenizing kinetic energies of the analyte ions by decelerating the analyte ions with a collision gas in a deceleration region that is pulsed temporarily to a pressure above a pressure at which the sample support is held at least for a desired duration of the bombardment, the timing of the collision gas pulsing being coordinated with said pulsed cluster bombardment. 2. The method according to claim 1 , wherein the sample support is held at a pressure of less than 10 pascal, and the collision gas is pulsed temporarily to a pressure above 10 pascal. 3. The method according to claim 1 , wherein the deceleration region is located in the interior of an RF ion guide. 4. The method according to claim 3 , wherein the deceleration region is located in the interior of an RF ion funnel. 5. The method according to claim 1 , wherein the uncharged clusters are generated and accelerated in a pulsed supersonic gas jet. 6. The method according to claim 5 further comprising redirecting a fraction of the gas from the pulsed supersonic gas jet to the deceleration region to be used as the collision gas. 7. The method according to claim 6 , wherein redirecting a fraction of the gas from the pulsed supersonic gas jet comprises redirecting said fraction with a skimmer that lets through a core of the pulsed super-sonic gas jet for the ionization of the analyte molecules on the sample support. 8. The method according to claim 1 , wherein the clusters comprise molecules of at least one of the polar compounds sulfur dioxide, water, and nitric acid. 9. The method according to claim 1 , wherein the clusters comprise molecules of at least one of the non-polar carbonic compounds carbon dioxide (CO 2 ), methane (CH 4 ), ethane (C 2 H 6 ), ethene (C 2 H 4 ), and ethyne (C 2 H 2 ). 10. The method according to claim 1 , wherein the clusters comprise molecules of at least one of the light acids hydrochloric acid, sulfuric acid, formic acid, and acetic acid. 11. The method according to claim 1 , wherein the pulsed bombardment of uncharged clusters comprises a bombardment using a pulsed supersonic hydrogen gas jet, and a velocity of the clusters is optimized through control of at least one of a starting temperature, a species and concentration of the cluster substance molecules, and an optional admixture of neutral gases such as nitrogen or argon, such that the analyte molecules are ionized with a high degree of ionization. 12. An ion source of a mass spectrometer, comprising: a cluster source generating a pulsed supersonic gas jet with uncharged molecular clusters; a sample support with analyte molecules on its surface, the sample support being arranged for receiving a pulsed bombardment of clusters from the supersonic gas jet; an RF ion guide for the capture and transmission of analyte ions, the RF ion guide being arranged in an opposing relation to the sample support; and a device for conveying pulsed collision gas into the RF ion guide so as to temporarily and repeatedly raise a pressure of the collision gas in the RF ion guide to a pressure above a pressure at which the sample support is held at least for a desired duration of the bombardment, a timing of the collision gas pulsing being coordinated with said pulsed cluster bombardment. 13. The ion source according to claim 12 , wherein the RF ion guide has the form and function of an RF ion funnel. 14. The ion source according to claim 12 , wherein the device for conveying pulsed collision gas into the RF ion guide comprises a skimmer to skim off gas from a periphery of the supersonic gas jet. 15. The ion source according to claim 14 , further comprising a device for feeding a portion of the gas skimmed off by the skimmer to an interior of the RF ion guide. 16. The ion source according to claim 12 , wherein the cluster source comprises a switching valve nozzle.

Assignees

Inventors

Classifications

  • H01J27/026Primary

    Cluster ion sources · CPC title

  • H01J49/142Primary

    using a solid target which is not previously vapourised · CPC title

  • with means for collisional cooling · CPC title

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What does patent US9263223B2 cover?
The invention relates to devices and methods in mass spectrometers for the generation of ions of heavy molecules, especially biomolecules, by bombarding them with uncharged clusters of molecules. The analyte ions which are generated or released by cluster bombardment of analyte substances on the surface of sample support plates show a broad distribution of their kinetic energies, which prevents…
Who is the assignee on this patent?
Bruker Daltonik Gmbh
What technology area does this patent fall under?
Primary CPC classification H01J27/026. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Feb 16 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).