Method to etch non-volatile metal materials
US-2015340603-A1 · Nov 26, 2015 · US
US9178136B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9178136-B2 |
| Application number | US-201213587642-A |
| Country | US |
| Kind code | B2 |
| Filing date | Aug 16, 2012 |
| Priority date | Aug 16, 2012 |
| Publication date | Nov 3, 2015 |
| Grant date | Nov 3, 2015 |
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The present disclosure provides a semiconductor memory device. The device includes a pinning layer having an anti-ferromagnetic material and disposed over a first electrode; a pinned layer disposed over the pinning layer; a tunneling layer disposed over the pinned layer, a free layer disposed over the tunneling layer and a capping layer disposed over the free layer. The capping layer includes metal-oxide and metal-nitride materials.
Opening claim text (preview).
What is claimed is: 1. A semiconductor memory device, comprising: a pinning layer over a first electrode; a pinned layer disposed over the pinning layer; a tunneling layer disposed over the pinned layer; a free layer disposed over the tunneling layer and including ferromagnetic materials; a capping layer disposed over the free layer, wherein the capping layer is configured to provide an etching resistance that protects the free layer and the tunneling layer from edge dama…
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