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Measuring method for width of color filter unit and manufacturing method for liquid crystal panel
US9136191B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9136191-B2 |
| Application number | US-201314234140-A |
| Country | US |
| Kind code | B2 |
| Filing date | Oct 21, 2013 |
| Priority date | Sep 26, 2013 |
| Publication date | Sep 15, 2015 |
| Grant date | Sep 15, 2015 |
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- Title
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Abstract
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The present invention provides a method of measuring a width of a color filter unit of a liquid crystal panel. The method includes providing a bottom glass substrate having a TFT array thereon; forming the color filter plate locating within an effective region of the liquid crystal panel by photo-etching process, and forming one or more measure modules locating of the liquid crystal panel and on the TFT array by the photo-etching process; and measuring widths of the one or more measure modules out of the effective region to obtain the width of the filter units within the effective region. The method provided is capable of effectively controlling widths of the color filter units formed in process of manufacturing the liquid crystal panel, thus quality of the liquid crystal panel is raised.
First claim
Opening claim text (preview).
What is claimed is: 1. A method of measuring a width of a color filter unit of a liquid crystal panel, comprising: providing a bottom glass substrate having a TFT array thereon; forming the color filter plate locating within an effective region of the liquid crystal panel by photo-etching process, and forming one or more measure modules locating of the liquid crystal panel and on the TFT array by the photo-etching process, wherein the color filter plate comprises a red filter un…
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Inventors
Classifications
Electricity · mapped topic
- H10P74/235Primary
Electricity · mapped topic
- G02B5/201Primary
Physics · mapped topic
Electricity · mapped topic
- H01L22/24Primary
Electricity · mapped topic
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Frequently asked questions
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- What does patent US9136191B2 cover?
- The present invention provides a method of measuring a width of a color filter unit of a liquid crystal panel. The method includes providing a bottom glass substrate having a TFT array thereon; forming the color filter plate locating within an effective region of the liquid crystal panel by photo-etching process, and forming one or more measure modules locating of the liquid crystal panel and o…
- Who is the assignee on this patent?
- Shenzhen China Star Optoelect, Shenzhen China Star Optoelect
- What technology area does this patent fall under?
- Primary CPC classification H10P74/235. Mapped technology areas include Electricity.
- When was this patent published?
- Publication date Tue Sep 15 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
- What related patents are in patentsdb?
- We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).