Methods of forming semiconductor devices
US-2024387699-A1 · Nov 21, 2024 · US
US9136162B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9136162-B2 |
| Application number | US-201314097617-A |
| Country | US |
| Kind code | B2 |
| Filing date | Dec 5, 2013 |
| Priority date | Dec 5, 2013 |
| Publication date | Sep 15, 2015 |
| Grant date | Sep 15, 2015 |
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A method includes forming a mandrel layer over a target layer, and etching the mandrel layer to form mandrels. The mandrels have top widths greater than respective bottom widths, and the mandrels define a first opening in the mandrel layer. The first opening has an I-shape and includes two parallel portions and a connecting portion interconnecting the two parallel portions. Spacers are formed on sidewalls of the first opening. The spacers fill the connecting portion, wherein a center portion of each of the two parallel portions is unfilled by the spacers. Portions of the first opening that are unfilled by the spacers are extended into the target layer.
Opening claim text (preview).
What is claimed is: 1. A method comprising: forming a mandrel layer over a target layer; etching the mandrel layer to form mandrels, wherein the mandrels have top widths greater than respective bottom widths, and wherein the mandrels define a first opening in the mandrel layer, wherein the first opening has an I-shape and comprises: two parallel portions; and a connecting portion interconnecting the two parallel portions; forming spacers on sidewalls of the first opening,…
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
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