Wafer processing method
US-2015357224-A1 · Dec 10, 2015 · US
US9117656B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9117656-B2 |
| Application number | US-201213595299-A |
| Country | US |
| Kind code | B2 |
| Filing date | Aug 27, 2012 |
| Priority date | Dec 19, 2011 |
| Publication date | Aug 25, 2015 |
| Grant date | Aug 25, 2015 |
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A semiconductor cleaning device includes an external electrode opposed to a side surface of the semiconductor device; a base configured to allow arrangement of the semiconductor device, and having an opening positioned between the side surface of the semiconductor device in the arranged state and the external electrode, and located below the side surface of the semiconductor device; a frame having an electrically insulating property, being in contact with the external electrode, arranged on the base and opposed to the side surface of the semiconductor device; and suction means connected to the opening in the base and being capable of taking in the foreign matter through the opening. Thereby, the semiconductor cleaning device and a semiconductor cleaning method that can remove the foreign matter adhered to the side surface of the semiconductor device and can prevent re-adhesion of the removed foreign matter can be obtained.
Opening claim text (preview).
What is claimed is: 1. A semiconductor cleaning device for removing foreign matter from a semiconductor device comprising: an external electrode opposed to a side surface of said semiconductor device; a base configured to allow arrangement of said semiconductor device, and having an opening positioned between the side surface of said semiconductor device in the arranged state and said external electrode, and located below the side surface of said semiconductor device; a frame…
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
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Electricity · mapped topic
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