Method for measuring surface parameter of copper foil, and method for sorting copper foil
US-2024418504-A1 · Dec 19, 2024 · US
US9025852B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9025852-B2 |
| Application number | US-201213482270-A |
| Country | US |
| Kind code | B2 |
| Filing date | May 29, 2012 |
| Priority date | May 30, 2011 |
| Publication date | May 5, 2015 |
| Grant date | May 5, 2015 |
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In one embodiment, a substrate inspection apparatus performs, in its maintenance mode, operations including: guiding a light emitted from an illuminating unit to an imaging device via a light-guiding member disposed in a casing; judging whether or not a level of a brightness signal obtained by the imaging device falls within a predetermined allowable range when a light emitted from the illuminating unit falls on the imaging device via the light-guiding member; and alarming, if it is judged that the value of the brightness signal is out of the predetermined allowable range, that replacement of the illuminating unit is required.
Opening claim text (preview).
The invention claimed is: 1. A substrate inspection apparatus comprising: a casing; a table disposed in the casing for placement of a substrate thereon; an illuminating unit provided to illuminate the substrate, placed on the table, with a light; an imaging unit having an imaging device provided to image the substrate placed on the table illuminated with the light; a mode selection unit configured to select one of an inspection mode in which an inspection of a substrate pl…
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
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