Apparatus and method for suppression of background noise in microscopy imaging

US9007582B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9007582-B2
Application numberUS-201414215521-A
CountryUS
Kind codeB2
Filing dateMar 17, 2014
Priority dateMar 15, 2013
Publication dateApr 14, 2015
Grant dateApr 14, 2015

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  2. Abstract

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  5. First independent claim

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Abstract

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An apparatus and method for imaging a section of a medium is disclosed. The apparatus or method receives and returns light from the section and from sites adjacent to the section. A microscope using this apparatus or method can be telecentric in pinhole space at the detection end of the system.

First claim

Opening claim text (preview).

What is claimed is: 1. An apparatus for imaging a section of a medium which receives and returns light from the section and from sites adjacent to the section, the apparatus comprising: an optical system for directing light in beams of different polarization in the medium along an optical axis and returning light from the medium, the optical system comprising: a pinhole lens assembly configured to receive the returned light, the pinhole lens assembly having a focal length, and wherein the focal length is configured such that a first focal point of the pinhole lens assembly is located substantially at a pupil of the optical system such that the pinhole assembly is telecentric; and a detector configured to receive the returned light from the pinhole lens assembly and produce an electrical signal in response to the received light. 2. The apparatus of claim 1 , further comprising a processor in communication with the detector and configured to generate an image of the section based on the electrical signal of the detector. 3. The apparatus of claim 1 , wherein the electrical signal of the detector is configured to correspond to a polarization parameter of the received light. 4. The apparatus of claim 3 , wherein the polarization parameter is a function of a differential circular dichroism or optical activity of the returned light. 5. The apparatus of claim 3 , wherein the polarization parameter is a degree of rotation of the polarization of the returned light. 6. The apparatus of claim 1 , wherein the beams overlap in the medium to reduce a portion of the light returned from the sites adjacent to the section that are spaced generally along the optical axis. 7. The apparatus of claim 1 , wherein the beams are incident in the medium at spots spaced from each other along the optical axis. 8. A method of imaging a section of a medium which receives and returns light from the section and from sites adjacent to the section, the method comprising the steps of: directing light in beams of different polarization to the medium along an optical axis; directing light returned from the medium to a detector by way of a pinhole assembly; causing the returned light to be substantially telecentric at the detector; detecting, at the detector, the returned light; and generating an image of the section from the detected light, the image generated in response to a polarization parameter of the returned light. 9. The method of claim 8 , wherein the beams overlap in the medium to reduce a portion of the light returned from the sites adjacent to the section which are spaced generally along the optical axis. 10. The method of claim 8 , wherein the beams are incident in the medium at spots spaced from each other along the optical axis. 11. The method of claim 8 , wherein the polarization parameter is a degree of rotation of the polarization of the returned light. 12. The method of claim 8 , wherein said polarization parameter is a function of a differential circular dichroism or optical activity of the returned light.

Assignees

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Classifications

  • Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers (G02B21/0036 - G02B21/008; means for illumination of specimens in general G02B21/06) · CPC title

  • G02B21/008Primary

    Details of detection or image processing, including general computer control · CPC title

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What does patent US9007582B2 cover?
An apparatus and method for imaging a section of a medium is disclosed. The apparatus or method receives and returns light from the section and from sites adjacent to the section. A microscope using this apparatus or method can be telecentric in pinhole space at the detection end of the system.
Who is the assignee on this patent?
Univ Rochester
What technology area does this patent fall under?
Primary CPC classification G02B21/008. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Apr 14 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).