Tungsten chemical-mechanical polishing composition
US-2015376462-A1 · Dec 31, 2015 · US
US8999850B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8999850-B2 |
| Application number | US-201113339797-A |
| Country | US |
| Kind code | B2 |
| Filing date | Dec 29, 2011 |
| Priority date | Dec 29, 2011 |
| Publication date | Apr 7, 2015 |
| Grant date | Apr 7, 2015 |
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Methods and apparatus for etching materials using tetramethylammonium hydroxide (TMAH) are described. The methods may involve including an additive when applying the TMAH to the material to be etched. The additive may be a gas, and in some situations may be clean dry air. The clean dry air may be provided with the TMAH to minimize or prevent the formation of hillocks in the etched structure. Apparatus for performing the methods are also described.
Opening claim text (preview).
What is claimed is: 1. A method, comprising: etching a trench in a crystalline semiconductor material disposed within an etching chamber by: introducing tetramethylammonium hydroxide (TMAH) into the etching chamber during an etching period; flowing clean dry air (CDA) into the etching chamber during at least part of the etching period; mixing the TMAH and CDA together in a supply line coupled to said etching chamber to form an etchant comprising a mixture of the TMAH with the…
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