Test data volume reduction based on test cube properties

Patent metadata

Field	Value
Publication number	US-8996941-B2
Application number	US-201313914529-A
Country	US
Kind code	B2
Filing date	Jun 10, 2013
Priority date	Jun 8, 2012
Publication date	Mar 31, 2015
Grant date	Mar 31, 2015

Abstract

Background scan cells are selected from scan cells in a circuit based on specified bit distribution information for a plurality of test cubes generated for testing the circuit. A main portion and a background portion are then determined for each test cube in the plurality of test cubes. The background portion corresponds to the background scan cells. Test cubes in the plurality of test cubes that have compatible main portions are merged into test cube groups. Each test cube group in the test cube groups comprises a main test cube and background test cubes. A main test cube, supplied by a tester or a decompressor, may be shifted into the scan chains. A background test cube may be shifted into background chains and be inserted into the main test cube in the scan chains based on control signals.

First claim

What is claimed is:

1. A method, executed by at least one processor of a computer, comprising:
selecting background scan cells from scan cells in a circuit based on specified bit distribution information for a plurality of test cubes generated for testing the circuit;
determining a main portion and a background portion for each test cube in the plurality of test cubes, the background portion corresponding to the background scan cells;
merging test cubes in the plurality of tes…

Assignees

• Mentor Graphics Corp

Inventors

• Lin Xijiang
• Rajski Janusz

Classifications

• G01R31/318544 Primary

  Physics · mapped topic

• G01R31/318547

  Physics · mapped topic

• G01R31/3177 Primary

  Physics · mapped topic