Writing method and erasing method of fusion memory
US-12002500-B2 · Jun 4, 2024 · US
US8995215B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8995215-B2 |
| Application number | US-201314081987-A |
| Country | US |
| Kind code | B2 |
| Filing date | Nov 15, 2013 |
| Priority date | Jun 28, 2005 |
| Publication date | Mar 31, 2015 |
| Grant date | Mar 31, 2015 |
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The present invention provides a semiconductor memory and a control method therefor, the semiconductor device including a first current-voltage conversion circuit connected to a core cell provided in a nonvolatile memory cell array, a second current-voltage conversion circuit connected to a reference cell through a reference cell data line, a sense amplifier sensing an output from the first current-voltage conversion circuit and an output from the second current-voltage conversion circuit, a compare circuit comparing a voltage level at the reference cell data line with a predefined voltage level, and a charging circuit charging the reference cell data line, if the voltage level at the reference cell data line is lower than the predefined voltage level during pre-charging the reference cell data line. According to the present invention, the pre-charging period of the reference cell data line can be shortened, and the data read time can be shortened.
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What is claimed is: 1. A method for fabricating a semiconductor device, comprising: fabricating a first current-voltage conversion circuit coupled to a core cell data line; forming a second current-voltage conversion circuit coupled a reference cell data line; and manufacturing a charging circuit coupled to the reference cell data line, wherein said charging circuit is operable to pre-charge the reference cell data line, and said reference cell data line is pre-charged faster…
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