Method of evaluating a semiconductor wafer dicing process

US8994022B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-8994022-B2
Application numberUS-201213443778-A
CountryUS
Kind codeB2
Filing dateApr 10, 2012
Priority dateApr 11, 2011
Publication dateMar 31, 2015
Grant dateMar 31, 2015

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  5. First independent claim

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Abstract

Official abstract text for this publication.

Embodiments of the disclosure relate to a method of evaluating a semiconductor wafer dicing process, comprising providing evaluation lines extending in at least one scribe line of the wafer, dicing the wafer in the scribe line, evaluating the length of the evaluation lines, providing an information about their length, and using the information to evaluate the dicing process.

First claim

Opening claim text (preview).

The invention claimed is: 1. A method of evaluating a semiconductor wafer dicing process, the method comprising: providing evaluation lines extending from an evaluation circuit into a first street of a plurality of streets on a wafer, the wafer further including functional circuits, the evaluation circuit and the functional circuits being arranged in columns and rows that are separated by the plurality of streets, the evaluation lines extending from a perimeter of the evaluation c…

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What does patent US8994022B2 cover?
Embodiments of the disclosure relate to a method of evaluating a semiconductor wafer dicing process, comprising providing evaluation lines extending in at least one scribe line of the wafer, dicing the wafer in the scribe line, evaluating the length of the evaluation lines, providing an information about their length, and using the information to evaluate the dicing process.
Who is the assignee on this patent?
Tailliet Francois, St Microelectronics Rousset
What technology area does this patent fall under?
Primary CPC classification H10P74/277. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Mar 31 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).