Selective cuts to remove predicted interconnect bulging regions
US-2024419882-A1 · Dec 19, 2024 · US
US8990751B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8990751-B2 |
| Application number | US-91394910-A |
| Country | US |
| Kind code | B2 |
| Filing date | Oct 28, 2010 |
| Priority date | Oct 28, 2010 |
| Publication date | Mar 24, 2015 |
| Grant date | Mar 24, 2015 |
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Official abstract text for this publication.
The present application discloses a method of preparing a layout for manufacturing an integrated circuit chip according to a circuit design. In at least one embodiment, a pattern for the layout based on the circuit design is generated. After the generation of the pattern, it is determined if at least one layout rule is violated in the layout, the at least one layout rule being specified according to a predetermined maximum value for at least one of an estimated voltage drop along a signal path in the layout or an estimated current density on the signal path. If the at least one layout rule is violated, a violation is indicated.
Opening claim text (preview).
What is claimed is: 1. A method of preparing a layout for manufacturing an integrated circuit chip according to a circuit design, the method comprising: generating a pattern for the layout based on the circuit design; determining, by a processor, if at least one layout rule is violated by the inclusion of the generated pattern in the layout, the at least one layout rule comprising a constraint on a relationship between a power line pattern and a device pattern in the layout, and…
Physics · mapped topic
Physics · mapped topic
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