TCA with scan paths, decompressor, compressor, and output shift register

Patent metadata

Field	Value
Publication number	US-8990650-B2
Application number	US-201314023068-A
Country	US
Kind code	B2
Filing date	Sep 10, 2013
Priority date	Jun 11, 2009
Publication date	Mar 24, 2015
Grant date	Mar 24, 2015

Abstract

The disclosure describes novel methods and apparatuses for accessing test compression architectures (TCA) in a device using either a parallel or serial access technique. The serial access technique may be controlled by a device tester or by a JTAG controller. Further the disclosure provides an approach to access the TCA of a device when the device exists in a daisy-chain arrangement with other devices, such as in a customer's system. Additional embodiments are also provided and described in the disclosure.

First claim

What is claimed is:

1. A programmable access test compression architecture comprising:
A. functional circuitry having test stimulus inputs and test response outputs;
B scan path circuits, each scan path circuit having a scan input, a scan output, a scan clock input, a scan enable input, stimulus outputs coupled to the stimulus inputs of the functional logic, and response inputs coupled to the response outputs of the functional logic;
C. decompressor circuitry having compressed…

Assignees

• Texas Instruments Inc

Inventors

• Whetsel Lee D

Classifications

• G06F11/2733

  Physics · mapped topic

• G01R31/3177 Primary

  Physics · mapped topic

• G01R31/318547 Primary

  Physics · mapped topic

• G01R31/318335 Primary

  Physics · mapped topic

• G01R31/3172

  Physics · mapped topic