Method and apparatus for bit-line sensing gates on an sram cell
US-2015364183-A1 · Dec 17, 2015 · US
US8988949B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8988949-B2 |
| Application number | US-201213633222-A |
| Country | US |
| Kind code | B2 |
| Filing date | Oct 2, 2012 |
| Priority date | Oct 2, 2012 |
| Publication date | Mar 24, 2015 |
| Grant date | Mar 24, 2015 |
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One or more techniques or systems for controlling a supply voltage of a cell are provided herein. Additionally, one or more techniques or systems for mitigating leakage of the cell are provided. In some embodiments, a header circuit is provided, including a first pull-up p-type metal-oxide-semiconductor (PMOS) transistor including a first gate, a first source, and a first drain. Additionally, the header circuit includes a second pull-down PMOS transistor including a second gate, a second source, and a second drain. In some embodiments, the first drain of the first pull-up PMOS transistor is connected to the second source of the second pull-down PMOS transistor and a supply voltage line for one or more cells. In this manner, a pull-down PMOS is configured to control the supply voltage of the cell, thus facilitating voltage control for a write assist, for example.
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What is claimed is: 1. A header circuit for controlling a supply voltage for a cell, comprising: a first pull-up p-type metal-oxide-semiconductor (PMOS) transistor, the first pull-up PMOS transistor comprising a first gate, a first source, and a first drain; a pull-up control unit configured to control biasing for the first gate of the first pull-UP PMOS transistor based on a shut down signal, a bank select signal, and a write mux signal, the shut down signal corresponding to a…
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