Methods for single exposure—self-aligned double, triple, and quadruple patterning

US8980757B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-8980757-B2
Application numberUS-201113993659-A
CountryUS
Kind codeB2
Filing dateDec 15, 2011
Priority dateDec 15, 2011
Publication dateMar 17, 2015
Grant dateMar 17, 2015

How to read this patent

A practical reading order for non-experts. Skip the full description unless you need deep technical detail.

  1. Title

    What the patent document calls the invention.

  2. Abstract

    A short plain-language summary of the technical disclosure.

  3. Assignees and inventors

    Who owns or filed the patent and who is credited as inventor.

  4. Key dates

    Filing, priority, publication, and grant dates set the timeline.

  5. First independent claim

    The legal scope of protection — read this for what is actually claimed.

  6. CPC / IPC classifications

    Technology tags used to group this patent with similar filings.

  7. Citations and related patents

    Prior art links and similar publications in this corpus.

Abstract

Official abstract text for this publication.

A method including forming a pattern on a surface of a substrate, the pattern including one of discrete structures including at least one sidewall defining an oblique angle relative to the surface and discrete structures complemented with a material layer therebetween, the material layer including a volume modified into distinct regions separated by at least one oblique angle relative to the surface; and defining circuit features on the substrate using the pattern, the features having a pitch less than a pitch of the pattern.

First claim

Opening claim text (preview).

The invention claimed is: 1. A method comprising: forming a pattern on a surface of a substrate, the pattern comprising one of discrete structures comprising at least one sidewall defining an oblique angle relative to the surface and discrete structures complemented with a material layer therebetween, the material layer comprising a volume modified into distinct regions separated by at least one oblique angle relative to the surface; and defining circuit features on the substrat…

Assignees

Inventors

Classifications

Patent family

Related publications grouped by family.

External sources

Next steps

Free tools are coming soon. Tell us what you want to track and we'll notify you.

Frequently asked questions

Answers are generated from the same data shown on this page.

What does patent US8980757B2 cover?
A method including forming a pattern on a surface of a substrate, the pattern including one of discrete structures including at least one sidewall defining an oblique angle relative to the surface and discrete structures complemented with a material layer therebetween, the material layer including a volume modified into distinct regions separated by at least one oblique angle relative to the su…
Who is the assignee on this patent?
Cinnor Fitih M, Wallace Charles H, Intel Corp
What technology area does this patent fall under?
Primary CPC classification H10P76/202. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Mar 17 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).