Hot-carrier injection programmable memory and method of programming such a memory
US-9224482-B2 · Dec 29, 2015 · US
US8975686B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8975686-B2 |
| Application number | US-201414201233-A |
| Country | US |
| Kind code | B2 |
| Filing date | Mar 7, 2014 |
| Priority date | May 23, 2008 |
| Publication date | Mar 10, 2015 |
| Grant date | Mar 10, 2015 |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
A semiconductor device includes a semiconductor layer with a trench dug downward from its surface, a source region formed on a surface layer portion adjacent to a first side of the trench in a prescribed direction, a drain region formed on the surface layer portion, adjacent to a second side of the trench opposite to the first side in the prescribed direction, a first insulating film on the bottom surface and the side surface of the trench, a floating gate stacked on the first insulating film and opposed to the bottom surface and the side surface of the trench through the first insulating film, a second insulating film formed on the floating gate, and a control gate at least partially embedded in the trench so that the portion embedded in the trench is opposed to the floating gate through the second insulating film.
Opening claim text (preview).
What is claimed is: 1. A semiconductor device comprising: a semiconductor layer having a surface; a trench extending downward from the surface of the semiconductor layer, the trench having a first side, a second side opposite the first side, and a bottom; a source region formed on a surface layer portion of the semiconductor layer adjacently to the first side of the trench in a prescribed direction; a drain region formed on the surface layer portion of the semiconductor laye…
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Related publications grouped by family.
Free tools are coming soon. Tell us what you want to track and we'll notify you.
Answers are generated from the same data shown on this page.