Production method for a semiconductor device
US-9530672-B2 · Dec 27, 2016 · US
US8975136B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8975136-B2 |
| Application number | US-201313769619-A |
| Country | US |
| Kind code | B2 |
| Filing date | Feb 18, 2013 |
| Priority date | Feb 18, 2013 |
| Publication date | Mar 10, 2015 |
| Grant date | Mar 10, 2015 |
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A super junction semiconductor device includes a semiconductor portion with a first surface and a parallel second surface. A doped layer of a first conductivity type is formed at least in a cell area. Columnar first super junction regions of a second, opposite conductivity type extend in a direction perpendicular to the first surface. Columnar second super junction regions of the first conductivity type separate the first super junction regions from each other. The first and second super junction regions form a super junction structure between the first surface and the doped layer. A distance between the first super junction regions and the second surface does not exceed 30 μm. The on-state or forward resistance of low-voltage devices rated for reverse breakdown voltages below 1000 V can be defined by the resistance of the super junction structure.
Opening claim text (preview).
What is claimed is: 1. A method of manufacturing a super junction semiconductor device, the method comprising: forming columnar first and second super junction regions of opposite conductivity types in a semiconductor substrate with a process surface, the first and second super junction regions extending in a direction perpendicular to the process surface and forming a super junction structure; thinning the semiconductor substrate from the process surface to obtain, from the sem…
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
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