Electronic device based on multilayer thin film and method for manufacturing the same using a three-dimensional structure
US-2024309503-A1 · Sep 19, 2024 · US
US8962437B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8962437-B2 |
| Application number | US-201213494400-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jun 12, 2012 |
| Priority date | Mar 19, 2012 |
| Publication date | Feb 24, 2015 |
| Grant date | Feb 24, 2015 |
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A method for fabricating a capacitor includes: forming a first silicon layer over a semiconductor substrate, where the first silicon layer is doped with a dopant; forming an undoped second silicon layer over the first silicon layer; forming an opening by etching the second silicon layer and the first silicon layer; forming a storage node in the opening; and removing the first silicon layer and the second silicon layer.
Opening claim text (preview).
What is claimed is: 1. A method for fabricating a capacitor, comprising: forming an etch stop layer over a semiconductor substrate having a storage node contact plug formed therein; forming a first silicon layer over the etch stop layer, wherein the first silicon layer is doped with a dopant; forming an undoped second silicon layer over the first silicon layer; forming an opening by etching the second silicon layer and the first silicon layer; forming a silicon oxide layer…
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
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