Phase change memory stack with treated sidewalls
US-2015318038-A1 · Nov 5, 2015 · US
US8962387B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8962387-B2 |
| Application number | US-201314053847-A |
| Country | US |
| Kind code | B2 |
| Filing date | Oct 15, 2013 |
| Priority date | Jan 20, 2012 |
| Publication date | Feb 24, 2015 |
| Grant date | Feb 24, 2015 |
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Some embodiments include methods of forming memory cells in which a metal oxide material is formed over a first electrode material, an oxygen-sink material is formed over and directly against the metal oxide material, and a second electrode material is formed over the oxygen-sink material. The second electrode material is of a different composition than the oxygen-sink material. The metal oxide material is treated to transfer oxygen from a region of the metal oxide material to the oxygen-sink material and thereby subdivide the metal oxide material into at least two regions, with one of the regions nearest the oxygen-sink material being relatively oxygen depleted relative to another of the regions.
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We claim: 1. A method of forming a memory cell, comprising: forming a metal oxide material over a first electrode material; forming an oxygen-sink material over and directly against the metal oxide material; forming a second electrode material over the oxygen-sink material, the second electrode material being of a different composition than the oxygen-sink material; and treating the metal oxide material to substantially irreversibly transfer oxygen from a region of the metal…
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
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