Apparatus and method for analyzing graphene and graphene boundary

US8945937B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-8945937-B2
Application numberUS-201313904526-A
CountryUS
Kind codeB2
Filing dateMay 29, 2013
Priority dateJun 20, 2012
Publication dateFeb 3, 2015
Grant dateFeb 3, 2015

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Abstract

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A method of analyzing graphene includes providing a first graphene structure including graphene having grains and grain boundaries, and a support portion for supporting the graphene, generating a second graphene structure by oxidizing the first graphene structure, and detecting a shape of the graphene.

First claim

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What is claimed is: 1. A method of analyzing graphene, the method comprising: providing a first graphene structure including, graphene having grains and grain boundaries, and a support portion for supporting the graphene; generating a second graphene structure by oxidizing the first graphene structure; and detecting a shape of the graphene. 2. The method of claim 1 , wherein the support portion is made of an oxidizable material.…

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What does patent US8945937B2 cover?
A method of analyzing graphene includes providing a first graphene structure including graphene having grains and grain boundaries, and a support portion for supporting the graphene, generating a second graphene structure by oxidizing the first graphene structure, and detecting a shape of the graphene.
Who is the assignee on this patent?
Samsung Electronics Co Ltd
What technology area does this patent fall under?
Primary CPC classification G01N21/17. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Feb 03 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).