Indirect acquisition of a signal from a device under test
US-12135353-B2 · Nov 5, 2024 · US
On-chip detection of types of operations tested by an LBIST
US8943377B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8943377-B2 |
| Application number | US-201213586227-A |
| Country | US |
| Kind code | B2 |
| Filing date | Aug 15, 2012 |
| Priority date | Aug 15, 2012 |
| Publication date | Jan 27, 2015 |
| Grant date | Jan 27, 2015 |
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- Title
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Abstract
Official abstract text for this publication.
An integrated circuit includes an LBIST controller operative to run a test program on at least one selection of core logic of the integrated circuit to test the operability of the at least one selection of core logic. The integrated circuit also includes a monitoring logic structure operative to detect at least one type of operation executed for the test program from at least one particular control signal activated by the LBIST controller for controlling the at least one selection of core logic to execute the test program from among at least one control signal for controlling operations on the at least one selection of core logic.
First claim
Opening claim text (preview).
What is claimed is: 1. An integrated circuit comprising: a Logic Built-in Self-Test (LBIST) structure operative to run a test program on at least one selection of core logic of the integrated circuit to test the operability of the at least one selection of core logic, the LBIST structure positioned on chip with the at least one selection of core logic, the test program specifying at least one operation for the LBIST structure to run on at least one test pattern through the at leas…
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Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
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Frequently asked questions
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- What does patent US8943377B2 cover?
- An integrated circuit includes an LBIST controller operative to run a test program on at least one selection of core logic of the integrated circuit to test the operability of the at least one selection of core logic. The integrated circuit also includes a monitoring logic structure operative to detect at least one type of operation executed for the test program from at least one particular con…
- Who is the assignee on this patent?
- Harper Michael W, Riley Mack W, IBM
- What technology area does this patent fall under?
- Primary CPC classification G01R31/3177. Mapped technology areas include Physics.
- When was this patent published?
- Publication date Tue Jan 27 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
- What related patents are in patentsdb?
- We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).