Position independent testing of circuits

Patent metadata

Field	Value
Publication number	US-8943376-B2
Application number	US-201414314430-A
Country	US
Kind code	B2
Filing date	Jun 25, 2014
Priority date	Feb 25, 1998
Publication date	Jan 27, 2015
Grant date	Jan 27, 2015

Abstract

Scan distributor, collector, and controller circuitry connect to the functional inputs and outputs of core circuitry on integrated circuits to provide testing through those functional inputs and outputs. Multiplexer and demultiplexer circuits select between the scan circuitry and the functional inputs and outputs. The core circuitry can also be provided with built-in scan distributor, collector, and controller circuitry to avoid having to add it external of the core circuitry. With appropriately placed built-in scan distributor and collector circuits, connecting together the functional inputs and outputs of the core circuitry also connects together the scan distributor and collector circuitry in each core. This can provide a hierarchy of scan circuitry and reduce the need for separate test interconnects and multiplexers.

First claim

What is claimed is:

1. An integrated circuit comprising:
A. an input pad;
B. an output pad;
C. first core circuitry having:
i. a first data input lead coupled to the input pad;
ii. a first data output lead;
iii. a second data input lead;
iv. a second data output lead coupled to the output pad;
v. first functional circuitry having a functional input formed of an input buffer circuit having an input coupled to the first data input lead, a functional output formed of an…

Assignees

• Texas Instruments Inc

Inventors

• Whetsel Lee D

Classifications

• G01R31/3177 Primary

  Physics · mapped topic

• G01R31/318536 Primary

  Physics · mapped topic

• G01R31/318572

  Physics · mapped topic

• G01R31/318558

  Physics · mapped topic