Systems and methods for monitoring and controlling industrial processes
US-2024361756-A1 · Oct 31, 2024 · US
US8942840B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8942840-B2 |
| Application number | US-201313743096-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jan 16, 2013 |
| Priority date | Jun 9, 2010 |
| Publication date | Jan 27, 2015 |
| Grant date | Jan 27, 2015 |
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A system and method for manufacturing semiconductor devices is disclosed. An embodiment comprises using desired device parameters to choose an initial manufacturing recipe. Once chosen, the initial manufacturing recipe may be modified by determining and applying an offset adjustment based on previous manufacturing to tune the recipes for the particular equipment to be utilized in the manufacturing process.
Opening claim text (preview).
What is claimed is: 1. A system for manufacturing a semiconductor device, the system comprising a first module to receive device parameters and output a main recipe based at least in part on the device parameters, wherein the device parameters are parameters of devices to be manufactured; a second module coupled to the first module to apply a compensation variable to the main recipe to form a control recipe, the control recipe controlling a semiconductor manufacturing process to…
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