Calibration of impedance

Patent metadata

Field	Value
Publication number	US-8937488-B2
Application number	US-201414266217-A
Country	US
Kind code	B2
Filing date	Apr 30, 2014
Priority date	Oct 17, 2011
Publication date	Jan 20, 2015
Grant date	Jan 20, 2015

Abstract

A semiconductor device has a first controlled chip, including a first replica output circuit having the same configuration as a first output circuit, a first ZQ terminal connected to the first replica output circuit, a first through electrode connected to the first ZQ terminal, and a first control circuit which sets the impedance of the first replica output circuit. A control chip includes a second ZQ terminal connected to the first through electrode, a comparator circuit which compares a voltage of the second ZQ terminal with a reference voltage, and a second control circuit 123 which performs a process based on a comparison by the comparator circuit. The first control circuit and the second control circuit receive a common input signal to operate and sequentially change and set the impedance until the comparison result changes when an external resistance element is connected to the second ZQ terminal.

First claim

What is claimed is:

1. A method to calibrate an impedance of a device having a plurality of stacked semiconductor devices interconnected by through electrodes, the method comprising:
coupling a resistor between an external terminal of the device and a first voltage source; and
in each semiconductor device of the plurality of stacked semiconductor devices;
enabling a replica output circuit having a first plurality of transistors connected between a second voltage source and a fi…

Assignees

• Ps4 Luxco Sarl

Inventors

• Riho Yoshiro

Classifications

• H03K19/0005 Primary

  Electricity · mapped topic

• H03K19/018521 Primary

  Electricity · mapped topic

• H04L25/0278

  Electricity · mapped topic