Semiconductor test system and method
US-9222977-B2 · Dec 29, 2015 · US
Generating test sets for diagnosing scan chain failures
US8935582B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8935582-B2 |
| Application number | US-201213460407-A |
| Country | US |
| Kind code | B2 |
| Filing date | Apr 30, 2012 |
| Priority date | Mar 4, 2007 |
| Publication date | Jan 13, 2015 |
| Grant date | Jan 13, 2015 |
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Abstract
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Embodiments of the disclosed technology comprise software-based techniques that can be used to improve scan chain test pattern generation and scan chain failure diagnosis resolution. For example, certain embodiments can be used to generate high quality chain diagnosis test patterns that are able to isolate a scan chain defect to a single scan cell. Such embodiments can be used to generate a “complete” test set—that is, a set of chain diagnosis test patterns that is able to isolate any scan chain defect in a faulty scan chain to a single scan cell.
First claim
Opening claim text (preview).
What is claimed is: 1. One or more computer-readable storage media storing computer-executable instructions for causing a computer to perform a method, the method comprising: performing a first test pattern generation technique targeting a fault caused by a possible defect at a scan cell N of a scan chain, the first test pattern generation technique being designed to generate a single test pattern for detecting the fault at the scan cell N; and performing a second test pattern g…
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Physics · mapped topic
- G01R31/318544Primary
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
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Frequently asked questions
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- What does patent US8935582B2 cover?
- Embodiments of the disclosed technology comprise software-based techniques that can be used to improve scan chain test pattern generation and scan chain failure diagnosis resolution. For example, certain embodiments can be used to generate high quality chain diagnosis test patterns that are able to isolate a scan chain defect to a single scan cell. Such embodiments can be used to generate a “co…
- Who is the assignee on this patent?
- Guo Ruifeng, Huang Yu, Cheng Wu-Tung, and 1 more
- What technology area does this patent fall under?
- Primary CPC classification G01R31/318544. Mapped technology areas include Physics.
- When was this patent published?
- Publication date Tue Jan 13 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
- What related patents are in patentsdb?
- We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).