High throughput hot testing method and system for high-brightness light-emitting diodes
US-9519033-B2 · Dec 13, 2016 · US
US8934089B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8934089-B2 |
| Application number | US-201213660765-A |
| Country | US |
| Kind code | B2 |
| Filing date | Oct 25, 2012 |
| Priority date | May 6, 2010 |
| Publication date | Jan 13, 2015 |
| Grant date | Jan 13, 2015 |
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Provided is an apparatus for analyzing an electroluminescence sample, which comprises: a pulse generator for applying a pulse driving signal to the electroluminescence sample; an electroluminescence (EL) detector for receiving electroluminescence which is emitted from the electroluminescence sample according to the application of the pulse driving signal, thereby acquiring a light-receiving signal; a temperature controller for varying the temperature of the electroluminescence sample; and an electroluminescence transient spectroscopy (ELTS) analysis unit for analyzing a change in a time division section of the light-receiving signal delayed depending on a change of the temperature of the electroluminescence sample, and acquiring information on a defect-type charge trap which exists in the electroluminescence sample.
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What is claimed is: 1. An apparatus for analysis of an electroluminescence sample comprising: a pulse generator configured for applying a pulse driving signal to the electroluminescence sample; an electroluminescence (EL) detector configured for acquiring a light-receiving signal by receiving electroluminescence emitted from the electroluminescence sample as a result of application of the pulse driving signal, wherein the light-receiving signal obtained by the EL detector is one…
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