Semiconductor device
US-2024421048-A1 · Dec 19, 2024 · US
US2026082945A1 · US · A1
| Field | Value |
|---|---|
| Publication number | US-2026082945-A1 |
| Application number | US-202519394119-A |
| Country | US |
| Kind code | A1 |
| Filing date | Nov 19, 2025 |
| Priority date | May 26, 2023 |
| Publication date | Mar 19, 2026 |
| Grant date | — |
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A semiconductor device includes a first lead including a base portion, a semiconductor element mounted on one side in a thickness direction of the base portion and having a first electrode disposed on the one side in the thickness direction and a second electrode disposed on the other side in the thickness direction, a second lead spaced apart from the base portion in a first direction orthogonal to the thickness direction, a first conductive member including a first portion bonded to the first electrode and a second portion bonded to the second lead and electrically connected to the first electrode and the second lead, a first bonding layer interposed between, and bonded to the base portion and the second electrode, and a second bonding layer interposed between, and bonded to the first electrode and the first portion. The first bonding layer includes a sintered metal.
Opening claim text (preview).
1 . A semiconductor device comprising: a first lead including a base portion; a semiconductor element mounted on one side in a thickness direction of the base portion and having a first electrode disposed on the one side in the thickness direction and a second electrode disposed on the other side in the thickness direction; a second lead spaced apart from the base portion in a first direction orthogonal to the thickness direction; a first conductive member including a first portion bonded to the first electrode and a second portion bonded to the second lead, the first conductive member being electrically connected to the first electrode and the second lead; a first bonding layer interposed between the base portion and the second electrode, and bonded to the base portion and the second electrode; and a second bonding layer interposed between the first electrode and the first portion, and bonded to the first electrode and the first portion, wherein the first bonding layer includes a sintered metal. 2 . The semiconductor device according to claim 1 , wherein the second bonding layer includes a conductive paste. 3 . The semiconductor device according to claim 2 , wherein the second bonding layer includes solder. 4 . The semiconductor device according to claim 1 , further comprising a third bonding layer interposed between the second lead and the second portion, and bonded to the second lead and the second portion. 5 . The semiconductor device according to claim 4 , wherein the third bonding layer includes a conductive paste. 6 . The semiconductor device according to claim 5 , wherein the third bonding layer includes solder. 7 . The semiconductor device according to claim 1 , wherein the first bonding layer has a dimension along the thickness direction smaller than a dimension of the second bonding layer along the thickness direction. 8 . The semiconductor device according to claim 1 , wherein the second lead is elongated in the first direction. 9 . The semiconductor device according to claim 1 , wherein the first conductive member is a plate-shaped metal member. 10 . The semiconductor device according to claim 9 , wherein the first conductive member contains copper. 11 . The semiconductor device according to claim 1 , further comprising: a third lead spaced apart from the base portion and the second lead; and a second conductive member, wherein the second conductive member is electrically connected to the first electrode and the third lead. 12 . The semiconductor device according to claim 11 , wherein the third lead is spaced apart from the second lead in a second direction orthogonal to the thickness direction and the first direction. 13 . The semiconductor device according to claim 11 , wherein the second conductive member is conductively bonded to the first portion and the third lead. 14 . The semiconductor device according to claim 13 , wherein the second conductive member is a plate-shaped metal member. 15 . The semiconductor device according to claim 13 , wherein the second conductive member is a bonding wire. 16 . The semiconductor device according to claim 11 , further comprising: a fourth lead spaced apart from the base portion in the first direction; and a third conductive member, wherein the semiconductor element has a third electrode disposed on the one side in the thickness direction, the fourth lead is spaced apart from the third lead in a second direction orthogonal to the thickness direction and the first direction, and the third conductive member is conductively bonded to the third electrode and the fourth lead. 17 . The semiconductor device according to claim 16 , wherein the semiconductor element is a switching element having a drain electrode, a source electrode, and a gate electrode, and the first electrode is the source electrode, the second electrode is the drain electrode, and the third electrode is the gate electrode. 18 . A vehicle comprising a power converter including the semiconductor device according to claim 17 .
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