Multilayer capacitor

Patent metadata

Field	Value
Publication number	US-2025210267-A1
Application number	US-202418770257-A
Country	US
Kind code	A1
Filing date	Jul 11, 2024
Priority date	Dec 21, 2023
Publication date	Jun 26, 2025
Grant date	—

Abstract

A multilayer capacitor may include a capacitor body including a dielectric layer and an internal electrode, and an external electrode disposed outside the capacitor body, where the internal electrode and the dielectric layer may include zirconium (Zr), and where an average content of zirconium (Zr) with respect to the entire internal electrode may be 0.0005 mol % or more and less than 5.0 mol %.

First claim

What is claimed is:

1 . A multilayer capacitor, comprising:
a capacitor body comprising a dielectric layer and an internal electrode; and an external electrode disposed outside the capacitor body, wherein each of the internal electrode and the dielectric layer includes zirconium (Zr), and wherein an average content of zirconium (Zr) in the internal electrode with respect to an entire component of the internal electrode is 0.0005 mol % or more and less than 5.0 mol %.

2 . The multilayer capacitor of claim 1 , wherein the internal electrode comprises a conductive metal and zirconium (Zr).

3 . The multilayer capacitor of claim 1 , wherein:
the dielectric layer comprises a primary component and a secondary component; and the primary component comprises (Ba 1-X Ca x ) m (Ti 1-y Zr y )O 3 (0.995≤m≤1.010, 0≤x≤0.10, 0<y≤0.20), Ba m (Ti 1-x Zr x )O 3 (0.995≤m≤1.010, x≤0.10), or a combination thereof.

4 . The multilayer capacitor of claim 1 , wherein the average content of zirconium (Zr) in the internal electrode with respect to the entire component of the internal electrode is 0.001 mol % to 1.0 mol %.

5 . The multilayer capacitor of claim 1 , wherein:
the dielectric layer comprises a central portion in a thickness direction and an interface portion of located on both surfaces of the central portion of the dielectric layer and contacting the internal electrode; an average content of zirconium (Zr) in the interface portion with respect to an entire component in the interface portion of the dielectric layer is 0.001 mol % to 10.0 mol %; and an average content of zirconium (Zr) in the central portion with respect to an entire component of the central portion of the dielectric layer is 0 mol % to 2.0 mol %.

6 . The multilayer capacitor of claim 5 , wherein:
the dielectric layer comprises a plurality of dielectric grains; the dielectric grain comprises a first dielectric grain located in the interface portion of the dielectric layer and a second dielectric grain located in the central portion of the dielectric layer; and an average particle diameter of the first dielectric grain is smaller than an average particle diameter of the second dielectric grain.

7 . The multilayer capacitor of claim 6 , wherein:
the average particle diameter of the first dielectric grain is 50 nm to 200 nm; and the average particle diameter of the second dielectric grain is 150 nm to 500 nm.

8 . The multilayer capacitor of claim 1 , wherein an average thickness of the dielectric layer is 0.1 μm to 5 μm.

9 . The multilayer capacitor of claim 1 , wherein an average thickness of the internal electrode is 0.1 μm to 2 μm.

10 . A multilayer capacitor, comprising:
a capacitor body comprising a dielectric layer and an internal electrode; and an external electrode disposed outside the capacitor body, wherein the internal electrode comprises a conductive metal and zirconium (Zr), wherein the dielectric layer comprises (Ba 1-X Ca x ) m (Ti 1-y Zr y )O 3 (0.995≤m≤1.010, 0≤x≤0.10, 0<y≤0.20), Ba m (Ti 1-x Zr x )O 3 (0.995≤m≤1.010, x≤0.10), or a combination thereof, and wherein an average content of zirconium (Zr) in the internal electrode with respect to an entire component of the internal electrode is 0.0005 mol % or more and less than 5.0 mol %.

11 . The multilayer capacitor of claim 10 , wherein the average content of zirconium (Zr) in the internal electrode with respect to the entire component of the internal electrode is 0.001 mol % to 1.0 mol %.

12 . The multilayer capacitor of claim 10 , wherein:
the dielectric layer comprises a central portion in a thickness direction and an interface portion located on both surfaces of the central portion and contacting the internal electrode; the average content of zirconium (Zr) with respect to the entire the interface portion of the dielectric layer is 0.001 mol % to 10.0 mol %; and the average content of zirconium (Zr) with respect to the entire the central portion of the dielectric layer is 0 mol % to 2.0 mol %.

13 . The multilayer capacitor of claim 12 , wherein:
the dielectric layer comprises a plurality of dielectric grains; at least one of the plurality of dielectric grain comprises a first dielectric grain located in the interface portion of the dielectric layer and a second dielectric grain located in the central portion of the dielectric layer; and an average particle diameter of the first dielectric grain is smaller than an average particle diameter of the second dielectric grain.

14 . The multilayer capacitor of claim 13 , wherein:
the average particle diameter of the first dielectric grain is 50 nm to 200 nm; and the average particle diameter of the second dielectric grain is 150 nm to 500 nm.

15 . The multilayer capacitor of claim 10 , wherein an average thickness of the dielectric layer is 0.1 μm to 5 μm.

16 . The multilayer capacitor of claim 1 , wherein an average thickness of the internal electrode is 0.1 μm to 2 μm.

Assignees

• Samsung Electro Mech

Inventors

• Hwang Hyunjun
• Park Jinkyung
• Jang Changsoo
• Jeong Munseong
• Jang Won Seok
• Kim Nayoung
• Kim Jungmin

Classifications

• H01G4/30

  Stacked capacitors (H01G4/33 takes precedence) · CPC title

• H01G4/1245 Primary

  containing also titanates · CPC title

• H01G4/08

  Inorganic dielectrics · CPC title

• H01G4/008 Primary

  Selection of materials · CPC title

• Y02E60/13

  Energy storage using capacitors · CPC title