Measurement system and method of determining a noise figure of a device under test

Patent metadata

Field	Value
Publication number	US-2025085334-A1
Application number	US-202318464124-A
Country	US
Kind code	A1
Filing date	Sep 8, 2023
Priority date	Sep 8, 2023
Publication date	Mar 13, 2025
Grant date	—

Abstract

A measurement system for determining a noise figure of a device under test is described. The measurement system determines a first total error power based on the output signal by a first noise canceling technique, wherein the first total error power includes systematic errors originating in the device under test and in the measurement system. The measurement system determines a second total error power based on the output signal by a different, second noise canceling technique. The second total error power includes systematic errors originating in the measurement system. The second total error power further includes noise originating in the device under test and in the measurement system outside of the measurement instrument. The measurement system is configured to subtract the first total error power from the second total error power, thereby obtaining an external noise power.

First claim

The embodiments of the invention in which an exclusive property or privilege is claimed are defined as follows:

1 . A measurement system for determining a noise figure of a device under test, the measurement system comprising a measurement instrument having an analysis circuit,
wherein the analysis circuit is configured to receive an output signal of the device under test, wherein the analysis circuit is configured to determine a first total error power based on the output signal by a first noise canceling technique, wherein the first total error power comprises systematic errors originating in the measurement system, wherein the analysis circuit is configured to determine a second total error power based on the output signal by a second noise canceling technique, wherein the second noise canceling technique differs from the first noise canceling technique, wherein the second total error power comprises systematic errors originating in the measurement system, wherein the second total error power further comprises noise originating in the device under test and in the measurement system outside of the measurement instrument, and wherein the analysis circuit is configured to subtract the first total error power from the second total error power, thereby obtaining an external noise power.

2 . The measurement system of claim 1 , wherein the first noise canceling technique is an IQ averaging technique.

3 . The measurement system of claim 1 , wherein the second noise canceling technique is an IQ noise canceling technique or a cross-correlation technique.

4 . The measurement system of claim 1 , further comprising a signal generator, wherein the signal generator is connectable to an input of the device under test, and wherein the signal generator is configured to generate and output a modulated input signal.

5 . The measurement system of claim 4 , wherein the signal generator is an external signal generator being established separately from the measurement instrument.

6 . The measurement system of claim 4 , wherein the signal generator is connectable to the analysis circuit directly,
wherein the analysis circuit is configured to determine a first generator error power based on the modulated input signal by the first noise canceling technique, wherein the first generator error power comprises systematic errors originating in the signal generator and in the remaining measurement system, wherein the analysis circuit is configured to determine a second generator error power based on the modulated input signal by the second noise canceling technique, wherein the second generator error power comprises systematic errors originating in the signal generator and in the remaining measurement system, wherein the second generator error power further comprises noise originating in the signal generator and in the remaining measurement system outside of the measurement instrument, and wherein the analysis circuit is configured to subtract the first generator error power from the second generator error power, thereby obtaining a signal generator noise power.

7 . The measurement system of claim 6 , wherein the analysis circuit is configured to correct the external noise power based on the signal generator noise power.

8 . The measurement system of claim 7 , wherein the measurement system is configured to determine a gain of the device under test, and wherein the analysis circuit is configured to scale the signal generator noise power based on the determined gain.

9 . The measurement system of claim 4 , wherein the signal generator is connected to the analysis circuit, wherein the analysis circuit is configured to receive the modulated input signal, and wherein the analysis circuit is configured to determine the external noise power based on the modulated input signal.

10 . The measurement system of claim 1 , further comprising a visualization circuit, wherein the visualization circuit is configured to generate visualization data based on the external noise power determined.

11 . The measurement system of claim 10 , wherein the measurement system further comprises a display, the display being configured to display the visualization data.

12 . The measurement system of claim 1 , wherein the determined external noise power comprises a single value for the whole bandwidth of the output signal and/or a plurality of values for the bandwidth of the output signal.

13 . A method of determining a noise figure of a device under test, the method comprising the steps of
providing the device under test and a measurement instrument having a analysis circuit, the analysis circuit being configured to perform a first noise canceling technique and a second noise canceling technique, wherein the second noise canceling technique differs from the first noise canceling technique; connecting the device under test to the analysis circuit; receiving, by the analysis circuit, an output signal of the device under test; determining, by the analysis circuit, a first total error power based on the output signal by the first noise canceling technique, wherein the first total error power comprises systematic errors originating in the measurement system; determining, by the analysis circuit, a second total error power based on the output signal by the second noise canceling technique, wherein the second total error power comprises systematic errors originating in the device under test and in the measurement system, wherein the second total error power further comprises noise originating in the device under test and in the measurement system outside of the measurement instrument; and subtracting, by the analysis circuit, the first total error power from the second total error power, thereby obtaining an external noise power.

14 . The method of claim 13 , wherein the first noise canceling technique is an IQ averaging technique.

15 . The method of claim 13 , wherein the second noise canceling technique is an IQ noise canceling technique or a cross-correlation technique.

16 . The method of claim 13 , further comprising the steps of
providing a signal generator; directly connecting the signal generator to the analysis circuit; generating, by the signal generator, a modulated input signal; determining, by the analysis circuit, a first generator error power based on the modulated input signal by the first noise canceling technique, wherein the first generator error power comprises systematic errors originating in the signal generator and in the remaining measurement system; determining, by the analysis circuit, a second generator error power based on the modulated input signal by the second noise canceling technique, wherein the second generator error power comprises systematic errors originating in the signal generator and in the remaining measurement system, wherein the second generator error power further comprises noise originating in the signal generator and in the remaining measurement system outside of the measurement instrument; and subtracting, by the analysis circuit, the first generator error power from the second generator error power, thereby obtaining a signal generator noise power.

17 . The method of claim 16 , wherein the external noise power is corrected based on the signal generator noise power by the analysis circuit.

18 . The method of claim 17 , wherein a gain of the device under test is determined by the measurement system, and wherein the signal generator noise power is scaled based on the determined gain.

19 . The method of claim

Assignees

• Rohde & Schwarz

Inventors

• Ramian Florian
• Werthmueller Karolin
• Lagler Andreas

Classifications

• G01R23/20

  Measurement of non-linear distortion · CPC title

• G01R29/26

  Measuring noise figure; Measuring signal-to-noise ratio · CPC title

• G01R31/2832 Primary

  Specific tests of electronic circuits not provided for elsewhere (G01R31/2801, G01R31/316 take precedence) · CPC title