Systems and methods for separating ions at about or above atmospheric pressure

Patent metadata

Field	Value
Publication number	US-2025062113-A1
Application number	US-202418937451-A
Country	US
Kind code	A1
Filing date	Nov 5, 2024
Priority date	Jan 28, 2016
Publication date	Feb 20, 2025
Grant date	—

Abstract

The invention generally relates to systems and methods for separating ions at about or above atmospheric pressure. In certain embodiments, the invention provides systems that include an ionization source that generates ions and an ion trap. The ion trap is maintained at about or above atmospheric pressure and includes a plurality of electrodes and at least one inlet configured to receive a gas flow and at least one outlet. The system is configured such that a combination of a gas flow and one or more electric fields produced by the electrodes separates the ions based on mass-to-charge ratio and sends the separated ions through the at least one outlet of the ion trap.

First claim

1 - 31 . (canceled)

32 . A system for separating and analyzing ions, the system comprising:
an ionization source that generates ions; an ion trap maintained at about or above atmospheric pressure that comprises an interior chamber, comprising a first exit port on a top of the chamber and a second exist port on a bottom of the chamber, a first channel operable coupled to the first exit port and comprising a first plurality of electrodes and a first channel outlet, and a second channel operable coupled to the second exit port and comprising a second plurality of electrodes and a second channel outlet; and an ion detector; wherein the system is configured such that a combination of a gas flow and one or more frequency components of an electric field produced in the chamber separates the ions based on mass-to-charge ratio and sends the separated ions through the first and second exit ports and through the first and second outlets to the ion detector.

33 . The system according to claim 32 , further comprising a gas source.

34 . The system according to claim 32 , wherein the ion detection is a mass spectrometer.

35 . The system according to claim 32 , further comprising a first ion focusing element positioned between the first and second outlets and the ion detector.

36 . The system according to claim 35 , wherein the ion focusing element focuses ions exiting the first outlet and ions existing the second outlet.

37 . The system according to claim 35 , wherein the system further comprising a second ion focusing element that is an ion mobility focusing element positioned after the first ion focusing element.

38 . The system according to claim 34 , wherein the mass spectrometer does not include a vacuum system.

39 . The system according to claim 32 , wherein the ion trap is a quadrupole ion trap.

40 . The system according to claim 39 , wherein the quadrupole ion trap is a rectalinear ion trap.

Assignees

• Purdue Research Foundation

Inventors

• Cooks Robert Graham
• Snyder Dalton
• Basu Amar S
• Peng Wen-Ping

Classifications

• H01J49/4295

  Storage methods · CPC title

• H01J49/429

  Scanning an electric parameter, e.g. voltage amplitude or frequency · CPC title

• H01J49/165

  Electrospray ionisation · CPC title

• H01J49/0013

  Miniaturised spectrometers, e.g. having smaller than usual scale, integrated conventional components · CPC title

• G01N27/623 Primary

  combined with mass spectrometry · CPC title