Automated analysis of complex matrices using mass spectrometer
US-RE50171-E · Oct 15, 2024 · US
Fourier transform ion cyclotron resonance mass spectrometer and method for concentrating ions for fourier transform ion cyclotron resonance mass spectrometry
US9129784B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9129784-B2 |
| Application number | US-201113882732-A |
| Country | US |
| Kind code | B2 |
| Filing date | Nov 21, 2011 |
| Priority date | Dec 3, 2010 |
| Publication date | Sep 8, 2015 |
| Grant date | Sep 8, 2015 |
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Abstract
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A Fourier transform ion cyclotron resonance mass spectrometer (FT-ICR MS) includes: an ionization source generating ions; a deceleration lens, on which the ions generated by the ionization source and spatially dispersed are incident, selectively decelerating the incident ions so as to decrease the distance between the ions; and an ion cyclotron resonance cell on which the ions passing through the deceleration lens are incident. By preventing dispersing of ions due to mass difference and converging the ions using the deceleration lens, the mass range that can be measured at one time can be extended. Also, measurement sensitivity can be improved since the ions are effectively introduced to the ICR cell.
First claim
Opening claim text (preview).
The invention claimed is: 1. A method for concentrating ions for Fourier transform ion cyclotron resonance mass spectrometry, comprising: propagating ions as the ions spatially diffuse; introducing the propagated ions to a deceleration lens; selectively decelerating the ions by the deceleration lens so as to decrease the distance between the ions; and introducing the ions passing through the deceleration lens to an ion cyclotron resonance cell, wherein the propagated ions…
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Physics · mapped topic
- H01J49/02Primary
Electricity · mapped topic
- H01J49/065Primary
Electricity · mapped topic
- G01N27/623Primary
Physics · mapped topic
Electricity · mapped topic
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- What does patent US9129784B2 cover?
- A Fourier transform ion cyclotron resonance mass spectrometer (FT-ICR MS) includes: an ionization source generating ions; a deceleration lens, on which the ions generated by the ionization source and spatially dispersed are incident, selectively decelerating the incident ions so as to decrease the distance between the ions; and an ion cyclotron resonance cell on which the ions passing through t…
- Who is the assignee on this patent?
- Choi Myoung Choul, Park A Leum, Kim Hyun Sik, and 3 more
- What technology area does this patent fall under?
- Primary CPC classification H01J49/02. Mapped technology areas include Electricity.
- When was this patent published?
- Publication date Tue Sep 08 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
- What related patents are in patentsdb?
- We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).