Temperature-based memory management

Patent metadata

Field	Value
Publication number	US-2024402935-A1
Application number	US-202418732845-A
Country	US
Kind code	A1
Filing date	Jun 4, 2024
Priority date	Nov 15, 2018
Publication date	Dec 5, 2024
Grant date	—

Abstract

Methods, systems, and devices for temperature-based memory management are described. A system may include a memory device and a host device. The host device may identify a temperature (e.g., of the memory device). The host device may determine a value for a parameter for operating the memory device—such as a timing, voltage, or frequency parameter—based on the temperature of the memory device. The host device may transmit signaling to the memory device or another component of the system based on the value of the parameter. In some cases, the host device may determine the temperature of the memory device based on an indication (e.g., provided by the memory device). In some cases, the host device may determine the temperature of the memory device based on a temperature of the host device or a temperature of another component of the system.

First claim

1 . (canceled)

2 . A method, comprising:
sensing, at a host device, a temperature of the host device; determining, at the host device, a respective value of one or more parameters for operating a memory device based at least in part on sensing the temperature of the host device; and transmitting signaling from the host device to the memory device based at least in part on determining the respective value of the one or more parameters.

3 . The method of claim 2 , wherein determining the respective value of the one or more parameters comprises:
determining a respective value of one or more timing parameters for operating the memory device based at least in part on sensing the temperature of the host device.

4 . The method of claim 2 , further comprising:
determining a temperature decrease of the host device based at least in part on sensing the temperature of the host device; and increasing a value of a write recovery time, decreasing a value of an access time, or both, based at least in part on determining the temperature decrease.

5 . The method of claim 2 , further comprising:
determining temperature increase of the host device based at least in part on sensing the temperature of the host device; and decreasing a value of a write recovery time, increasing a value of an access time, or both, based at least in part on determining the temperature increase.

6 . The method of claim 2 , wherein determining the respective value of the one or more parameters comprises:
determining a respective value of one or more voltage parameters for operating the memory device based at least in part on sensing the temperature of the host device.

7 . The method of claim 6 , wherein the one or more voltage parameters comprise one or more reference voltages, one or more bias voltages, or a combination thereof.

8 . The method of claim 2 , wherein determining the respective value of the one or more parameters comprises:
determining a respective value of one or more frequency parameters for operating the memory device based at least in part on sensing the temperature of the host device.

9 . The method of claim 2 , further comprising:
determining a temperature increase of the host device based at least in part on sensing the temperature of the host device; and reducing one or more frequencies for operating the memory device based at least in part on determining the temperature increase.

10 . The method of claim 2 , further comprising:
determining, at the host device, that a change in temperature of the host device satisfies a threshold based at least in part on sensing the temperature of the host device; transmitting, to the memory device based at least in part on determining that the change in temperature of the host device satisfies the threshold, a request for an indication of a temperature of the memory device; and receiving, from the memory device based at least in part on transmitting the request, the indication of the temperature of the memory device, wherein determining the respective value of the one or more parameters for operating the memory device is based at least in part on the indication the temperature of the memory device.

11 . A host device, comprising:
a controller configured to couple with a memory device, wherein the controller is configured to cause the host device to:
sense a temperature of the host device;
determine a respective value of one or more parameters for operating the memory device based at least in part on sensing the temperature of the host device; and
transmit signaling from the host device to the memory device based at least in part on determining the respective value of the one or more parameters.

12 . The host device of claim 11 , wherein, to determine the respective value of the one or more parameters, the controller is configured to cause the host device to:
determine a respective value of one or more timing parameters for operating the memory device based at least in part on sensing the temperature of the host device.

13 . The host device of claim 11 , wherein the controller is configured to cause the host device to:
determine a temperature decrease of the host device based at least in part on sensing the temperature of the host device; and increase a value of a write recovery time, decreasing a value of an access time, or both, based at least in part on determining the temperature decrease.

14 . The host device of claim 11 , wherein the controller is configured to cause the host device to:
determine temperature increase of the host device based at least in part on sensing the temperature of the host device; and decrease a value of a write recovery time, increasing a value of an access time, or both, based at least in part on determining the temperature increase.

15 . The host device of claim 11 , wherein, to determine the respective value of the one or more parameters, the controller is configured to cause the host device to:
determine a respective value of one or more voltage parameters for operating the memory device based at least in part on sensing the temperature of the host device.

16 . The host device of claim 15 , wherein the one or more voltage parameters comprise one or more reference voltages, one or more bias voltages, or a combination thereof.

17 . The host device of claim 11 , wherein, to determine the respective value of the one or more parameters, the controller is configured to cause the host device to:
determine a respective value of one or more frequency parameters for operating the memory device based at least in part on sensing the temperature of the host device.

18 . The host device of claim 11 , wherein the controller is configured to cause the host device to:
determine a temperature increase of the host device based at least in part on sensing the temperature of the host device; and reduce one or more frequencies for operating the memory device based at least in part on determining temperature increase.

19 . The host device of claim 11 , wherein the controller is configured to cause the host device to:
determine, at the host device, that a change in temperature of the host device satisfies a threshold based at least in part on sensing the temperature of the host device; transmit, to the memory device based at least in part on determining that the change in temperature of the host device satisfies the threshold, a request for an indication of a temperature of the memory device; and receive, from the memory device based at least in part on transmitting the request, the indication of the temperature of the memory device, wherein determining the respective value of the one or more parameters for operating the memory device is based at least in part on the indication the temperature of the memory device.

20 . A non-transitory computer-readable medium storing code comprising instructions which, when executed by one or more processors of a host device, cause the host device to:
sense a temperature of the host device; determine, at the host device, a respective value of one or more parameters for operating a memory device based at least in part on sensing the temperature of the host device; and transmit signaling from the host device to the memory device based at least in part on determining the respective value of the one or more parameters.

21 . The non-transitory computer-readable medium of claim 20 ,
wherein, to determine the respective value of the one or more parameters, the i

Assignees

• Micron Technology Inc

Inventors

• Mayer Peter
• Hein Thomas
• Spirkl Wolfgang Anton
• Brox Martin
• Richter Michael Dieter

Classifications

• G11C7/04 Primary

  with means for avoiding disturbances due to temperature effects · CPC title

• G11C11/4074

  Power supply or voltage generation circuits, e.g. bias voltage generators, substrate voltage generators, back-up power, power control circuits · CPC title

• G06F3/0604

  Improving or facilitating administration, e.g. storage management · CPC title

• G06F3/0673

  Single storage device · CPC title

• G06F3/0659

  Command handling arrangements, e.g. command buffers, queues, command scheduling · CPC title